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Thin film analysis by X-ray scattering /

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Birkholz, Mario.

Thin film analysis by X-ray scattering /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Thin film analysis by X-ray scattering /Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel.
Author:	Birkholz, Mario.
other author:	Fewster, Paul F.
Published:	Weinheim :Wiley-VCH ;c2006.
Description:	xxii, 356 p. :ill. ;25 cm.
Subject:	X-ray spectroscopy.
ISBN:	3527310525 :

Thin film analysis by X-ray scattering /
Birkholz, Mario.

Thin film analysis by X-ray scattering /Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel. - Weinheim :Wiley-VCH ;c2006. - xxii, 356 p. :ill. ;25 cm.

Includes bibliographical references and index.

ISBN: 3527310525 :NT$4130

Standard No.: 9783527310524

Nat. Bib. No.: GBA545029bnbSubjects--Topical Terms:

188603
X-ray spectroscopy.

LC Class. No.: QC176.83 / B619 2006

Thin film analysis by X-ray scattering /
LDR:00667cam 2200205 a 450 001 167500
003 OCoLC
005 20001103152647.0
008 090528s2006 gw m a001 0 eng
015 $2 bnb $a GBA545029
020 $a 3527310525 : $c NT$4130
024 3 $a 9783527310524
035 $a 00198933
040 $a UKM $b eng $c UKM $d BAKER $d IXA $d TXH
042 $a ukblsr
049 $a OSUU
050 0 0 $a QC176.83 $b B619 2006
100 $a Birkholz, Mario. $3 237733
245 1 0 $a Thin film analysis by X-ray scattering / $c Mario Birkholz with contributions by Paul F. Fewster, Christoph Genzel.
260 $a Weinheim : $a [Chichester : $c c2006. $b Wiley-VCH ; $b John Wiley, distributor],
300 $a xxii, 356 p. : $b ill. ; $c 25 cm.
504 $a Includes bibliographical references and index.
650 $a X-ray spectroscopy. $3 188603
650 $a Thin films. $3 203678
700 $a Fewster, Paul F. $3 237731
700 $a Genzel, Christoph. $3 237732

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QC176.83 B619 2006

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1 records • Pages 1 •
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