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Semiconductor memories :technology, ...
~
IEEE Solid-State Circuits Council.
Semiconductor memories :technology, testing, and reliability /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Semiconductor memories :Ashok K. Sharma.
Reminder of title:
technology, testing, and reliability /
Author:
Sharma, Ashok K.
Published:
New York :IEEE Press ;c1997.
Description:
xii, 462 p. :ill. ;26 cm.
Notes:
"IEEE Solid-State Circuits Council, sponsor."
Notes:
"IEEE order number: PC3491"--P. [4] cover.
Subject:
Semiconductor storage devices.
ISBN:
0780310004 :
Semiconductor memories :technology, testing, and reliability /
Sharma, Ashok K.
Semiconductor memories :
technology, testing, and reliability /Ashok K. Sharma. - New York :IEEE Press ;c1997. - xii, 462 p. :ill. ;26 cm.
"IEEE Solid-State Circuits Council, sponsor."
Includes bibliographical references and index.
ISBN: 0780310004 :NT$3650
LCCN: 96006824 Subjects--Topical Terms:
238314
Semiconductor storage devices.
LC Class. No.: TK7895.M4 / S531 1997
Dewey Class. No.: 621.39/732
Semiconductor memories :technology, testing, and reliability /
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technology, testing, and reliability /
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Ashok K. Sharma.
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c1997.
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IEEE Press ;
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26 cm.
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"IEEE Solid-State Circuits Council, sponsor."
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"IEEE order number: PC3491"--P. [4] cover.
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2 records • Pages 1 •
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西方語文圖書區(四樓)
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320000397424
西方語文圖書區(四樓)
1圖書
一般圖書
TK7895.M4 S531 1997
一般使用(Normal)
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2 records • Pages 1 •
1
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