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Applied scanning probe methods /
~
Bhushan, Bharat, (1949-)
Applied scanning probe methods /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Applied scanning probe methods /Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].
other author:
Bhushan, Bharat,
Published:
Berlin ;Springer,c2004.
Description:
xx, 476 p. :ill. ;24 cm.
Series:
Nanoscience and technology
Subject:
MaterialsMicroscopy.
ISBN:
3540005277 (alk. paper) :
Applied scanning probe methods /
Applied scanning probe methods /
Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]. - Berlin ;Springer,c2004. - xx, 476 p. :ill. ;24 cm. - Nanoscience and technology.
Includes bibliographical references and index.
ISBN: 3540005277 (alk. paper) :NT5999
LCCN: 2003059049Subjects--Topical Terms:
192645
Materials
--Microscopy.
LC Class. No.: TA417.23 / .A655 2004
Dewey Class. No.: 620.1/1299
Applied scanning probe methods /
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Applied scanning probe methods /
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Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].
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Berlin ;
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New York :
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c2004.
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Springer,
300
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xx, 476 p. :
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ill. ;
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24 cm.
440
0
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Nanoscience and technology
504
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Includes bibliographical references and index.
650
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Materials
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Microscopy.
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192645
650
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Scanning probe microscopy.
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189049
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Bhushan, Bharat,
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1949-
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214174
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Fuchs, H.
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(Harald)
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436931
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Hosaka, Sumio.
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247901
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320000260408
西方語文圖書區(四樓)
1圖書
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TA417.23 A652 2004
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1 records • Pages 1 •
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