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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials :Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002 /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials :edited by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon.
Reminder of title:	Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002 /
other author:	Rosenwaks, Yossi.
corporate name:
Published:	Dordrecht :Kluwer Academic Publishers,2005.
Description:	v.: digital
Series:	NATO Science Series II: Mathematics, Physics and Chemistry, ;
Subject:	Physics
Online resource:	http://dx.doi.org/10.1007/1-4020-3019-3
ISBN:	9781402030178 (paper)

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials :Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002 /
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials :Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002 /[electronic resource] :edited by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon. - Dordrecht :Kluwer Academic Publishers,2005. - v.: digital - NATO Science Series II: Mathematics, Physics and Chemistry, ;186,1568-2609 ;.

ISBN: 9781402030178 (paper)Subjects--Topical Terms:

218415
Physics

LC Class. No.: TA417.23 / .N384 2002

Dewey Class. No.: 620.1/1

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials :Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002 /
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245 1 0 $a Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : $b Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002 / $c edited by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon. $h [electronic resource] :
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650 # 0 $a Physics $3 218415
650 # 0 $a Optical materials $3 252496
650 # 0 $a Nanotechnology $3 216697
650 # 0 $a Surfaces (Physics) $3 224173
650 # 0 $a Condensed matter $3 252497
650 # 0 $a Optical and Electronic Materials $3 252498
650 # 0 $a Surfaces and Interfaces, Thin Films $3 252499
650 # 0 $a Condensed Matter $3 252500
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950 $a Physics and Astronomy (Springer-11651; ZDB-2-PHA)