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Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Lifetime Spectroscopy :by Stefan Rein.
Reminder of title:	A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Author:	Rein, Stefan.
Published:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005.
Description:	v.: digital
Series:	Springer Series in Material Science, ;
Subject:	Optical materials
Online resource:	http://dx.doi.org/10.1007/3-540-27922-9
ISBN:	9783540253037 (paper)

Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Rein, Stefan.

Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /[electronic resource] :by Stefan Rein. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005. - v.: digital - Springer Series in Material Science, ;85,0933-033X ;.

ISBN: 9783540253037 (paper)Subjects--Topical Terms:

252496
Optical materials

LC Class. No.: TK7871.15.S55 / R45 2005

Dewey Class. No.: 537

Lifetime Spectroscopy :A Method of Defect Characterization in Silicon for Photovoltaic Applications /
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020 $a 9783540279228 (electronic bk.)
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050 1 4 $a TK7871.15.S55 $b R45 2005
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090 $a TK7871.15.S55 $b R364 2005
100 0 $a Rein, Stefan. $3 252935
245 1 0 $a Lifetime Spectroscopy : $b A Method of Defect Characterization in Silicon for Photovoltaic Applications / $c by Stefan Rein. $h [electronic resource] :
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440 0 $a Springer Series in Material Science, ; $v 85, $x 0933-033X ;
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650 # 0 $a Particles (Nuclear physics) $3 204127
650 # 0 $a Optical and Electronic Materials $3 252498
650 # 0 $a Solid State Physics and Spectroscopy $3 252501
650 # 0 $a Physics $3 218415
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950 $a Physics and Astronomy (Springer-11651; ZDB-2-PHA)