國立高雄大學圖資館 |

Language: English

Back

Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Physical Principles of Electron Microscopy :by Ray F. Egerton.
Reminder of title:	An Introduction to TEM, SEM, and AEM /
Author:	Egerton, Ray F..
Published:	Boston, MA :Springer Science+Business Media, Inc.,2005.
Description:	v.: digital
Subject:	Microscopy
Online resource:	http://dx.doi.org/10.1007/b136495
ISBN:	9780387258003 (paper)

Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /
Egerton, Ray F..

Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /[electronic resource] :by Ray F. Egerton. - Boston, MA :Springer Science+Business Media, Inc.,2005. - v.: digital

ISBN: 9780387258003 (paper)Subjects--Topical Terms:

253504
Microscopy

LC Class. No.: QH212.E4 / E354 2005

Dewey Class. No.: 502

Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /
LDR:00797nmm a2200217 a 4500 001 174850
003 Springer
005 20070808110738.0
006 m e
007 cr nn 008mamaa
008 090528s2005 nyu j eng d
020 $a 9780387258003 (paper)
020 $a 9780387260167 (electronic bk.)
035 $a 00279264
050 0 0 $a QH212.E4 $b E354 2005
082 0 4 $2 22 $a 502
090 $a QH212.E4 $b E29 2005
100 0 $a Egerton, Ray F.. $3 253503
245 1 0 $a Physical Principles of Electron Microscopy : $b An Introduction to TEM, SEM, and AEM / $c by Ray F. Egerton. $h [electronic resource] :
260 # $a Boston, MA : $c 2005. $b Springer Science+Business Media, Inc.,
300 $b v.: digital
650 # 0 $a Microscopy $3 253504
650 # 0 $a Chemistry $3 236337
650 # 0 $a Characterization and Evaluation Materials $3 252649
650 # 0 $a Biological Microscopy $3 253505
650 # 0 $a Materials $3 252605
856 4 0 $u http://libsw.nuk.edu.tw/login?url=http://dx.doi.org/10.1007/b136495 $z http://dx.doi.org/10.1007/b136495
950 $a Chemistry and Materials Science (Springer-11644; ZDB-2-CMS)