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Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Physical Principles of Electron Microscopy :by Ray F. Egerton.
其他題名:	An Introduction to TEM, SEM, and AEM /
作者:	Egerton, Ray F..
出版者:	Boston, MA :Springer Science+Business Media, Inc.,2005.
面頁冊數:	v.: digital
標題:	Microscopy
電子資源:	http://dx.doi.org/10.1007/b136495
ISBN:	9780387258003 (paper)

Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /
Egerton, Ray F..

Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /[electronic resource] :by Ray F. Egerton. - Boston, MA :Springer Science+Business Media, Inc.,2005. - v.: digital

ISBN: 9780387258003 (paper)Subjects--Topical Terms:

253504
Microscopy

LC Class. No.: QH212.E4 / E354 2005

Dewey Class. No.: 502

Physical Principles of Electron Microscopy :An Introduction to TEM, SEM, and AEM /
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