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System-on-chip test architectures :n...
~
Stroud, Charles E.
System-on-chip test architectures :nanometer design for testability /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
System-on-chip test architectures :edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
Reminder of title:
nanometer design for testability /
other author:
Wang, Laung-Terng.
Published:
Amsterdam ;Morgan Kaufmann Publishers,c2008.
Description:
xxxvi, 856 p. :ill. ;25 cm.
Series:
The Morgan Kaufmann series in systems on silicon
Subject:
Integrated circuitsVery large scale integration
ISBN:
9780123739735
System-on-chip test architectures :nanometer design for testability /
System-on-chip test architectures :
nanometer design for testability /edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. - Amsterdam ;Morgan Kaufmann Publishers,c2008. - xxxvi, 856 p. :ill. ;25 cm. - The Morgan Kaufmann series in systems on silicon .
Includes bibliographical references and index.
ISBN: 9780123739735
LCCN: 2007023373 Subjects--Topical Terms:
257763
Integrated circuits
--Very large scale integration
LC Class. No.: TK7895.E42 / S978 2008
Dewey Class. No.: 621.39/5
System-on-chip test architectures :nanometer design for testability /
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nanometer design for testability /
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edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
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c2008.
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Morgan Kaufmann Publishers,
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xxxvi, 856 p. :
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ill. ;
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25 cm.
440
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The Morgan Kaufmann series in systems on silicon
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Includes bibliographical references and index.
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Integrated circuits
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Very large scale integration
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257763
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Integrated circuits
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Very large scale integration
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264935
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Testing.
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Wang, Laung-Terng.
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Stroud, Charles E.
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Touba, Nur A.
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264933
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320000465528
西方語文圖書區(四樓)
1圖書
一般圖書
TK7895.E42 S995 2008
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1 records • Pages 1 •
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