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Transmission Electron Microscopy and...
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Fultz, Brent.
Transmission Electron Microscopy and Diffractometry of Materials /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Transmission Electron Microscopy and Diffractometry of Materials /by Brent Fultz, James M. Howe.
Author:
Fultz, Brent.
other author:
Howe, James M.
Published:
Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2008.
Description:
xix, 758 p. :ill., digital ;24 cm.
Contained By:
Springer e-books
Subject:
MaterialsMicroscopy.
Online resource:
http://dx.doi.org/10.1007/978-3-540-73886-2
ISBN:
9783540738855 (paper)
Transmission Electron Microscopy and Diffractometry of Materials /
Fultz, Brent.
Transmission Electron Microscopy and Diffractometry of Materials /
[electronic resource] /by Brent Fultz, James M. Howe. - Third Edition. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2008. - xix, 758 p. :ill., digital ;24 cm.
ISBN: 9783540738855 (paper)Subjects--Topical Terms:
192645
Materials
--Microscopy.
LC Class. No.: TA417.23 / .F85 2008
Dewey Class. No.: 620.11299
Transmission Electron Microscopy and Diffractometry of Materials /
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Transmission Electron Microscopy and Diffractometry of Materials /
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by Brent Fultz, James M. Howe.
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[electronic resource] /
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Third Edition.
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Berlin, Heidelberg :
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2008.
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Springer-Verlag Berlin Heidelberg,
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xix, 758 p. :
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ill., digital ;
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24 cm.
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Materials
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Microscopy.
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Transmission electron microscopy.
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Chemistry.
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Characterization and Evaluation of Materials.
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Crystallography.
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Physics and Applied Physics in Engineering.
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Solid State Physics and Spectroscopy.
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Surfaces and Interfaces, Thin Films.
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Howe, James M.
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Chemistry and Materials Science (Springer-11644; ZDB-2-CMS)
based on 0 review(s)
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電子館藏
1圖書
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EB TA417.23 .F974 2008
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1 records • Pages 1 •
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http://libsw.nuk.edu.tw:81/login?url=http://dx.doi.org/10.1007/978-3-540-73886-2
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