Language:
English
繁體中文
Help
圖資館首頁
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Emerging Nanotechnologies :Test, Def...
~
SpringerLink (Online service)
Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Emerging Nanotechnologies :edited by Mohammad Tehranipoor.
Reminder of title:
Test, Defect Tolerance, and Reliability /
other author:
Tehranipoor, Mohammad.
Published:
Boston, MA :Springer Science+Business Media, LLC,2008.
Description:
xii, 405 p. :ill., digital ;24 cm.
Series:
Frontiers in Electronic Testing, ;
Contained By:
Springer eBooks
Subject:
Nanotechnology.
Online resource:
http://dx.doi.org/10.1007/978-0-387-74747-7
ISBN:
9780387747460 (paper)
Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /
Emerging Nanotechnologies :
Test, Defect Tolerance, and Reliability /[electronic resource] :edited by Mohammad Tehranipoor. - Boston, MA :Springer Science+Business Media, LLC,2008. - xii, 405 p. :ill., digital ;24 cm. - Frontiers in Electronic Testing, ;37,0929-1296 ;.
ISBN: 9780387747460 (paper)Subjects--Topical Terms:
193873
Nanotechnology.
LC Class. No.: T174.7 / .E44 2008
Dewey Class. No.: 620.5
Emerging Nanotechnologies :Test, Defect Tolerance, and Reliability /
LDR
:00927nmm _22002415a_450
001
185108
003
Springer
005
20080414145637.0
006
m d
007
cr nn 008maaau
008
090528s2008 maua j eng d
020
$a
9780387747460 (paper)
020
$a
9780387747477 (electronic bk.)
035
$a
00330756
050
0 0
$a
T174.7
$b
.E44 2008
082
0 0
$2
22
$a
620.5
090
$a
T174.7
$b
.E53 2008
245
0 0
$a
Emerging Nanotechnologies :
$b
Test, Defect Tolerance, and Reliability /
$c
edited by Mohammad Tehranipoor.
$h
[electronic resource] :
260
#
$a
Boston, MA :
$c
2008.
$b
Springer Science+Business Media, LLC,
300
$a
xii, 405 p. :
$b
ill., digital ;
$c
24 cm.
440
0
$a
Frontiers in Electronic Testing, ;
$v
37,
$x
0929-1296 ;
650
# 0
$a
Nanotechnology.
$3
193873
650
# 0
$a
Microtechnology.
$3
258003
650
# 0
$a
Engineering.
$3
210888
650
# 0
$a
Circuits and Systems.
$3
274416
650
# 0
$a
Electronic and Computer Engineering.
$3
274098
650
# 0
$a
Electronics and Microelectronics, Instrumentation.
$3
274412
650
# 0
$a
Quality Control, Reliability, Safety and Risk.
$3
274011
700
0 #
$a
Tehranipoor, Mohammad.
$3
275473
710
0 #
$a
SpringerLink (Online service)
$3
273601
773
0 #
$t
Springer eBooks
856
4 0
$u
http://libsw.nuk.edu.tw:81/login?url=http://dx.doi.org/10.1007/978-0-387-74747-7
$z
http://dx.doi.org/10.1007/978-0-387-74747-7
950
$a
Engineering (Springer-11647; ZDB-2-ENG)
based on 0 review(s)
ALL
電子館藏
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
000000010482
電子館藏
1圖書
電子書
EB T174.7 .E53 2008
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Multimedia file
http://libsw.nuk.edu.tw:81/login?url=http://dx.doi.org/10.1007/978-0-387-74747-7
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login