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Design for Manufacturability and Yie...
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Chiang, Charles C..
Design for Manufacturability and Yield for Nano-Scale CMOS
Record Type:
Electronic resources : Monograph/item
Title/Author:
Design for Manufacturability and Yield for Nano-Scale CMOSby Charles C. Chiang, Jamil Kawa.
Author:
Chiang, Charles C..
other author:
Kawa, Jamil.
Published:
Dordrecht :Springer,2006.
Description:
154 p. :ill., digital ;24 cm.
Series:
Series on Integrated Circuits and Systems,
Contained By:
Springer e-books
Subject:
Computer Science.
Online resource:
http://dx.doi.org/10.1007/978-1-4020-5188-3
ISBN:
9781402051876 (paper)
Design for Manufacturability and Yield for Nano-Scale CMOS
Chiang, Charles C..
Design for Manufacturability and Yield for Nano-Scale CMOS
[electronic resource] /by Charles C. Chiang, Jamil Kawa. - Dordrecht :Springer,2006. - 154 p. :ill., digital ;24 cm. - Series on Integrated Circuits and Systems,1558-9412.
ISBN: 9781402051876 (paper)Subjects--Topical Terms:
212513
Computer Science.
Dewey Class. No.: 621.38
Design for Manufacturability and Yield for Nano-Scale CMOS
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Design for Manufacturability and Yield for Nano-Scale CMOS
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by Charles C. Chiang, Jamil Kawa.
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[electronic resource] /
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2006.
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154 p. :
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ill., digital ;
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24 cm.
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Kawa, Jamil.
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Computer Science (Springer-11645; ZDB-2-SCS)
based on 0 review(s)
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000000011695
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1圖書
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EB TK7874 C32 2006
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1 records • Pages 1 •
1
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http://libsw.nuk.edu.tw:81/login?url=http://dx.doi.org/10.1007/978-1-4020-5188-3
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