Advanced production testing of RF, S...
Engelhardt, Michael.

 

  • Advanced production testing of RF, SoC, and SiP devices /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Advanced production testing of RF, SoC, and SiP devices /Joe Kelly, Michael Engelhardt.
    Author: Kelly, Joe.
    other author: Engelhardt, Michael.
    Published: Boston :Artech House,c2007.
    Description: xx, 301 p. :ill. ;24 cm.
    Series: Artech House microwave library
    Subject: Systems on a chipTesting.
    ISBN: 9781580537094
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  • 1 records • Pages 1 •
 
320000458994 西方語文圖書區(四樓) 1圖書 一般圖書 TK7895.E42 K29 2007 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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