Measurement and modeling of silicon ...
Cressler, John D.

 

  • Measurement and modeling of silicon heterostructure devices /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Measurement and modeling of silicon heterostructure devices /edited by John D. Cressler.
    other author: Cressler, John D.
    Published: Boca Raton, FL :CRC Press,c2008.
    Description: 1 v. (various pagings) :ill. ;27 cm.
    Subject: Bipolar transistorsMathematical models.
    ISBN: 9781420066920
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  • 1 records • Pages 1 •
 
320000469181 西方語文圖書區(四樓) 1圖書 一般圖書 TK7871.96.B55 M484 2008 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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