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Fundamentals of nanoscale film analy...
~
Alford, Terry L.
Fundamentals of nanoscale film analysis /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Fundamentals of nanoscale film analysis /Terry L. Alford, Leonard C. Feldman, James W. Mayer.
Author:
Alford, Terry L.
other author:
Mayer, James W.,
Published:
New York, N.Y. :Springer,c2007.
Description:
xiv, 336 p. :ill. ;25 cm.
Subject:
Thin films.
Online resource:
http://www.loc.gov/catdir/toc/fy0713/2005933265.html
Online resource:
http://www.loc.gov/catdir/enhancements/fy0824/2005933265-d.html
ISBN:
0387292616 (e-book)
Fundamentals of nanoscale film analysis /
Alford, Terry L.
Fundamentals of nanoscale film analysis /
Terry L. Alford, Leonard C. Feldman, James W. Mayer. - New York, N.Y. :Springer,c2007. - xiv, 336 p. :ill. ;25 cm.
Includes bibliographical references and index.
ISBN: 0387292616 (e-book)
LCCN: 2005933265
Nat. Bib. No.: GBA631488bnbSubjects--Topical Terms:
203678
Thin films.
LC Class. No.: QC176.83 / .A44 2006
Dewey Class. No.: 621.3815/2
Fundamentals of nanoscale film analysis /
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Terry L. Alford, Leonard C. Feldman, James W. Mayer.
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c2007.
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xiv, 336 p. :
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Includes bibliographical references and index.
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西方語文圖書區(四樓)
Items
1 records • Pages 1 •
1
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Call number
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Attachments
320000485096
西方語文圖書區(四樓)
1圖書
一般圖書
QC176.83 A389 2007
一般使用(Normal)
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0
1 records • Pages 1 •
1
Multimedia
Multimedia file
http://www.loc.gov/catdir/toc/fy0713/2005933265.html
http://www.loc.gov/catdir/enhancements/fy0824/2005933265-d.html
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