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Test and diagnosis of analogue, mixe...

Institution of Engineering and Technology.

Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Test and diagnosis of analogue, mixed-signal and RF integrated circuits :edited by Yichuang Sun.
Reminder of title:	the system on chip approach /
other author:	Sun, Yichuang.
Published:	London :Institution of Engineering and Technology,2008.
Description:	xx, 389 p. :ill. ;24 cm.
Subject:	Linear integrated circuitsTesting.
ISBN:	0863417450 (pbk.)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /
Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /edited by Yichuang Sun. - London :Institution of Engineering and Technology,2008. - xx, 389 p. :ill. ;24 cm. - Circuits, devices and systems series ;19. - IET circuits, devices and systems series ;19..

Includes bibliographical references and index.

ISBN: 0863417450 (pbk.)

Nat. Bib. No.: GBA788513bnbSubjects--Topical Terms:

306900
Linear integrated circuits
--Testing.

LC Class. No.: TK7874.654 / T626 2008

Dewey Class. No.: 621.38150287

Test and diagnosis of analogue, mixed-signal and RF integrated circuits :the system on chip approach /
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008 090528s2008 enka 001 0 eng
015 $2 bnb $a GBA788513
020 $a 0863417450 (pbk.)
020 $a 9780863417450 (pbk.) : $c NT$3224
035 $a 00358451
040 $a UKM $c UKM $d BAKER $d BTCTA $d BWK $d BWX $d C#P $d CDX $d YDXCP
050 4 $a TK7874.654 $b T626 2008
082 0 4 $2 22 $a 621.38150287
245 0 0 $a Test and diagnosis of analogue, mixed-signal and RF integrated circuits : $b the system on chip approach / $c edited by Yichuang Sun.
260 $a London : $c 2008. $b Institution of Engineering and Technology,
300 $a xx, 389 p. : $b ill. ; $c 24 cm.
490 1 $a Circuits, devices and systems series ; $v 19
504 $a Includes bibliographical references and index.
650 $a Linear integrated circuits $x Testing. $3 306900
650 $a Mixed signal circuits $x Testing. $3 278525
650 $a Radio frequency integrated circuits $x Testing. $3 306896
700 $a Sun, Yichuang. $3 190268
710 $a Institution of Engineering and Technology. $3 306899
830 $a IET circuits, devices and systems series ; $v 19. $3 447092