| Record Type: |
Language materials, printed
: monographic
|
| Paralel Title: |
Avanced nano-scale inspection technology |
| Secondary Intellectual Responsibility: |
伍秀菁, |
| Secondary Intellectual Responsibility: |
汪若文, |
| Secondary Intellectual Responsibility: |
吳振勇, |
| Place of Publication: |
新竹市 |
| Published: |
國家實驗研究院儀器科技研究中心出版; 全華總經銷; |
| Year of Publication: |
2009[民98] |
| Edition: |
初版 |
| Description: |
24,654面圖,表,照片 : 26公分; |
| Subject: |
奈米技術 - |
| Notes: |
含參考書目 |
| Notes: |
含索引 |
| ISBN: |
978-986-81409-4-3 |