Language:
English
繁體中文
Help
圖資館首頁
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Fault injection techniques and tools...
~
Benso, Alfredo.
Fault injection techniques and tools for embedded systems reliability evaluation
Record Type:
Electronic resources : Monograph/item
Title/Author:
Fault injection techniques and tools for embedded systems reliability evaluationedited by Alfredo Benso and Paolo Prinetto.
other author:
Benso, Alfredo.
Published:
Boston :Kluwer Academic Publishers,c2003.
Description:
xiv, 241 p. :ill., digital ;25 cm.
Series:
Frontiers in electronic testing ;
Contained By:
Springer e-books
Subject:
Embedded computer systemsTesting.
Online resource:
http://dx.doi.org/10.1007/b105828
ISBN:
9780306487118 (electronic bk.)
Fault injection techniques and tools for embedded systems reliability evaluation
Fault injection techniques and tools for embedded systems reliability evaluation
[electronic resource] /edited by Alfredo Benso and Paolo Prinetto. - Boston :Kluwer Academic Publishers,c2003. - xiv, 241 p. :ill., digital ;25 cm. - Frontiers in electronic testing ;23.
ISBN: 9780306487118 (electronic bk.)
LCCN: 2003061871Subjects--Topical Terms:
345162
Embedded computer systems
--Testing.
LC Class. No.: TK7895.E42 / F38 2003
Dewey Class. No.: 004.256
Fault injection techniques and tools for embedded systems reliability evaluation
LDR
:00857nmm 2200253 a 4500
001
216703
003
GreenPo
005
20090518110524.0
006
m d
007
cr nn 008maaau
008
091014s2003 mau j eng d
010
$a
2003061871
020
$a
9780306487118 (electronic bk.)
020
$a
9781402075896 (paper)
035
$a
978-1-4020-7589-6
050
0 0
$a
TK7895.E42
$b
F38 2003
082
0 0
$a
004.256
$2
22
090
0 0
$a
TK7895.E42
$b
F263 2003
245
0 0
$a
Fault injection techniques and tools for embedded systems reliability evaluation
$h
[electronic resource] /
$c
edited by Alfredo Benso and Paolo Prinetto.
260
$a
Boston :
$c
c2003.
$b
Kluwer Academic Publishers,
300
$a
xiv, 241 p. :
$b
ill., digital ;
$c
25 cm.
440
0
$a
Frontiers in electronic testing ;
$v
23
650
0
$a
Embedded computer systems
$x
Testing.
$3
345162
650
0
$a
Embedded computer systems
$x
Reliability.
$3
345163
650
0
$a
Fault location (Engineering)
$3
266155
700
1
$a
Benso, Alfredo.
$3
345160
700
1
$a
Prinetto, Paolo.
$3
345161
710
2
$a
SpringerLink (Online service)
$3
273601
773
0
$t
Springer e-books
856
4 0
$u
http://dx.doi.org/10.1007/b105828
950
$a
Engineering
based on 0 review(s)
ALL
電子館藏
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
000000029631
電子館藏
1圖書
電子書
EB TK7895.E42 F263 2003
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Multimedia file
http://dx.doi.org/10.1007/b105828
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login