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平均數與全距管制圖之偏態與峰態修正 = Skewness and Kur...

國立高雄大學統計學研究所

平均數與全距管制圖之偏態與峰態修正 = Skewness and Kurtosis Correction for Xbar and R Control Charts

Record Type:	Language materials, printed : monographic
Paralel Title:	Skewness and Kurtosis Correction for Xbar and R Control Charts
Author:	王信堡,
Secondary Intellectual Responsibility:	國立高雄大學
Place of Publication:	[高雄市]
Published:	撰者;
Year of Publication:	2009[民98]
Description:	40面圖、表 : 30公分;
Subject:	Shewhart方法
Subject:	Shewhart method
Online resource:	http://handle.ncl.edu.tw/11296/ndltd/26323689414918872175
Notes:	參考書目：面
Notes:	指導教授：蘇志成
Summary:	本論文提出利用偏態與峰態修正(SKC)方法來建構Xbar與R管制圖。此SKC方法的管制界線是以Shewhart管制圖為基礎，並依據分佈之偏態與峰態進行調整。當資料來自於Weibull,lognormal和Burr分配，所建構之SKC管制圖將與其他管制圖進行型I錯誤機率值的比較。模擬的結果顯示當分佈為非對稱且高狹峰時，我們提出之SKC方法的型I錯誤機率比其他方法更接近原先設定之機率值0.27%。 This thesis proposes a skewness and kurtosis correction (SKC)method to set up Xbar and R control charts for processmonitoring. The developed SKC control limits take account of theskewness and kurtosis of process distribution, and are simplyadjustments of the conventional Shewhart control charts. Type Irisks of the proposed control charts are compared with those of someexisting control charts when the underlying distribution is Weibull,lognormal, and Burr. Simulation results show that if the underlyingdistribution is asymmetric and leptokuric, then our SKC methodoffers considerable improvement over the existing control chartswhen it is desirable for Type I risks to close to 0.27% .

平均數與全距管制圖之偏態與峰態修正 = Skewness and Kurtosis Correction for Xbar and R Control Charts
王, 信堡

平均數與全距管制圖之偏態與峰態修正 = Skewness and Kurtosis Correction for Xbar and R Control Charts / 王信堡撰 - [高雄市] : 撰者, 2009[民98]. - 40面 ; 圖、表 ; 30公分.
參考書目：面指導教授：蘇志成.
Shewhart方法Shewhart method

平均數與全距管制圖之偏態與峰態修正 = Skewness and Kurtosis Correction for Xbar and R Control Charts
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328 $a 碩士論文--國立高雄大學統計學研究所
330 $a 本論文提出利用偏態與峰態修正(SKC)方法來建構Xbar與R管制圖。此SKC方法的管制界線是以Shewhart管制圖為基礎，並依據分佈之偏態與峰態進行調整。當資料來自於Weibull,lognormal和Burr分配，所建構之SKC管制圖將與其他管制圖進行型I錯誤機率值的比較。模擬的結果顯示當分佈為非對稱且高狹峰時，我們提出之SKC方法的型I錯誤機率比其他方法更接近原先設定之機率值0.27%。 This thesis proposes a skewness and kurtosis correction (SKC)method to set up Xbar and R control charts for processmonitoring. The developed SKC control limits take account of theskewness and kurtosis of process distribution, and are simplyadjustments of the conventional Shewhart control charts. Type Irisks of the proposed control charts are compared with those of someexisting control charts when the underlying distribution is Weibull,lognormal, and Burr. Simulation results show that if the underlyingdistribution is asymmetric and leptokuric, then our SKC methodoffers considerable improvement over the existing control chartswhen it is desirable for Type I risks to close to 0.27% .
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