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Electrothermal analysis of VLSI systems

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Cheng, Yi-Kan.

Electrothermal analysis of VLSI systems

Record Type:	Electronic resources : Monograph/item
Title/Author:	Electrothermal analysis of VLSI systemsYi-Kan Cheng ... [et al.].
other author:	Cheng, Yi-Kan.
Published:	Boston :Kluwer Academic Publishers,c2002.
Description:	xviii, 210 p. :ill., digital ;25 cm.
Contained By:	Springer e-books
Subject:	Integrated circuitsVery large scale integration
Online resource:	http://dx.doi.org/10.1007/b117332
ISBN:	9780306470240 (electronic bk.)

Electrothermal analysis of VLSI systems
Electrothermal analysis of VLSI systems[electronic resource] /Yi-Kan Cheng ... [et al.]. - Boston :Kluwer Academic Publishers,c2002. - xviii, 210 p. :ill., digital ;25 cm.

ISBN: 9780306470240 (electronic bk.)Subjects--Topical Terms:

182468
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / .E54 2002

Dewey Class. No.: 621.395

Electrothermal analysis of VLSI systems
LDR:00717nmm 2200229 a 4500 001 265441
003 GreenPo
005 20101013150139.0
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007 cr nn 008maaau
008 101102s2002 mau s j eng d
020 $a 9780306470240 (electronic bk.)
020 $a 9780792378617 (paper)
035 $a 978-0-7923-7861-7
050 0 0 $a TK7874.75 $b .E54 2002
082 0 0 $a 621.395 $2 21
090 $a TK7874.75 $b .E38 2002
245 0 0 $a Electrothermal analysis of VLSI systems $h [electronic resource] / $c Yi-Kan Cheng ... [et al.].
260 $a Boston : $b Kluwer Academic Publishers, $c c2002.
300 $a xviii, 210 p. : $b ill., digital ; $c 25 cm.
650 0 $a Integrated circuits $x Very large scale integration $x Mathematical models. $3 182468
650 0 $a Semiconductors $x Thermal properties $x Mathematical models. $3 469319
650 0 $a Thermal analysis $x Data processing. $3 469320
650 0 $a Metal oxide semiconductors $x Mathematical models. $3 257823
650 0 $a Metal oxide semiconductors, Complementary $x Mathematical models. $3 469321
700 1 $a Cheng, Yi-Kan. $3 469318
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer e-books
856 4 0 $u http://dx.doi.org/10.1007/b117332
950 $a Engineering

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EB TK7874.75 .E54 2002 c2002.

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http://dx.doi.org/10.1007/b117332

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