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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Record Type:	Electronic resources : Monograph/item
Title/Author:	Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuitsMichael L. Bushnell, Vishwani D. Agrawal.
Author:	Bushnell, Michael L.
other author:	Agrawal, Vishwani D.
Published:	Boston :Kluwer Academic,c2002.
Description:	xviii, 690 p. :ill., digital ;26 cm.
Series:	Frontiers in electronic testing ;
Contained By:	Springer e-books
Subject:	Integrated circuitsVery large scale integration
Online resource:	http://dx.doi.org/10.1007/b117406
ISBN:	9780306470400 (electronic bk.)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Bushnell, Michael L.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits[electronic resource] /Michael L. Bushnell, Vishwani D. Agrawal. - Boston :Kluwer Academic,c2002. - xviii, 690 p. :ill., digital ;26 cm. - Frontiers in electronic testing ;17.

ISBN: 9780306470400 (electronic bk.)Subjects--Topical Terms:

182401
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / .B87 2002

Dewey Class. No.: 621.395

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
LDR:00832nmm 2200241 a 4500 001 265454
003 GreenPo
005 20100726165729.0
006 m d
007 cr nn 008maaau
008 101102s2002 mau s j eng d
020 $a 9780306470400 (electronic bk.)
020 $a 9780792379911 (paper)
035 $a 978-0-7923-7991-1
050 0 0 $a TK7874.75 $b .B87 2002
082 0 0 $a 621.395 $2 21
090 $a TK7874.75 $b .B979 2002
100 1 $a Bushnell, Michael L. $3 469344
245 1 0 $a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits $h [electronic resource] / $c Michael L. Bushnell, Vishwani D. Agrawal.
260 $a Boston : $b Kluwer Academic, $c c2002.
300 $a xviii, 690 p. : $b ill., digital ; $c 26 cm.
440 0 $a Frontiers in electronic testing ; $v 17
650 0 $a Integrated circuits $x Very large scale integration $x Testing. $3 182401
650 0 $a Digital integrated circuits $x Testing. $3 182402
650 0 $a Mixed signal circuits $x Testing. $3 278525
650 0 $a Semiconductor storage devices $x Testing. $3 345116
700 1 $a Agrawal, Vishwani D. $3 469345
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer e-books
856 4 0 $u http://dx.doi.org/10.1007/b117406
950 $a Engineering