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Nanometer technology designshigh-qua...
~
Ahmed, Nisar.
Nanometer technology designshigh-quality delay tests /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Nanometer technology designsby Mohammad Tehranipoor, Nisar Ahmed.
Reminder of title:
high-quality delay tests /
Author:
Tehranipoor, Mohammad.
other author:
Ahmed, Nisar.
Published:
Boston, MA :Springer US,2008.
Description:
xvii, 281 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Nanoelectronics.
Online resource:
http://dx.doi.org/10.1007/978-0-387-75728-5
ISBN:
9780387757285 (electronic bk.)
Nanometer technology designshigh-quality delay tests /
Tehranipoor, Mohammad.
Nanometer technology designs
high-quality delay tests /[electronic resource] :by Mohammad Tehranipoor, Nisar Ahmed. - Boston, MA :Springer US,2008. - xvii, 281 p. :ill., digital ;24 cm.
ISBN: 9780387757285 (electronic bk.)Subjects--Topical Terms:
308072
Nanoelectronics.
Dewey Class. No.: 621.381548
Nanometer technology designshigh-quality delay tests /
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by Mohammad Tehranipoor, Nisar Ahmed.
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Engineering (Springer-11647)
based on 0 review(s)
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電子館藏
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1
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Attachments
000000049634
電子館藏
1圖書
電子書
EB TK7874 2008
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0
1 records • Pages 1 •
1
Multimedia
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http://dx.doi.org/10.1007/978-0-387-75728-5
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