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Advanced test methods for SRAMseffec...

Bosio, Alberto.

Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Advanced test methods for SRAMsby Alberto Bosio ... [et al.].
Reminder of title:	effective solutions for dynamic fault detection in nanoscaled technologies /
other author:	Bosio, Alberto.
Published:	Boston, MA :Springer-Verlag US,2010.
Description:	xv, 171 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Random access memoryTesting.
Online resource:	http://dx.doi.org/10.1007/978-1-4419-0938-1
ISBN:	9781441909381 (electronic bk.)

Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /
Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /[electronic resource] :by Alberto Bosio ... [et al.]. - Boston, MA :Springer-Verlag US,2010. - xv, 171 p. :ill., digital ;24 cm.

ISBN: 9781441909381 (electronic bk.)Subjects--Topical Terms:

185576
Random access memory
--Testing.

LC Class. No.: TK7895.M4 / A3185 2010

Dewey Class. No.: 621.3973

Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /
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020 $a 9781441909374 (paper)
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245 0 0 $a Advanced test methods for SRAMs $h [electronic resource] : $b effective solutions for dynamic fault detection in nanoscaled technologies / $c by Alberto Bosio ... [et al.].
260 $a Boston, MA : $b Springer-Verlag US, $c 2010.
300 $a xv, 171 p. : $b ill., digital ; $c 24 cm.
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650 2 4 $a Computer-Aided Engineering (CAD, CAE) and Design. $3 274500
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