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Minimizing and exploiting leakage in...

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Jayakumar, Nikhil.

Minimizing and exploiting leakage in VLSI design

Record Type:	Electronic resources : Monograph/item
Title/Author:	Minimizing and exploiting leakage in VLSI designby Nikhil Jayakumar ... [et al.].
other author:	Jayakumar, Nikhil.
Published:	Boston, MA :Springer Science+Business Media, LLC,2010.
Description:	xxvii, 214 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Integrated circuitsVery large scale integration
Online resource:	http://dx.doi.org/10.1007/978-1-4419-0950-3
ISBN:	9781441909503 (electronic bk.)

Minimizing and exploiting leakage in VLSI design
Minimizing and exploiting leakage in VLSI design[electronic resource] /by Nikhil Jayakumar ... [et al.]. - Boston, MA :Springer Science+Business Media, LLC,2010. - xxvii, 214 p. :ill., digital ;24 cm.

ISBN: 9781441909503 (electronic bk.)Subjects--Topical Terms:

257763
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75 / .M56 2010

Dewey Class. No.: 621.395

Minimizing and exploiting leakage in VLSI design
LDR:00764nmm 2200229 a 4500 001 274278
003 Springer
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006 m d
007 cr nn 008maaau
008 101221s2010 mau s j eng d
020 $a 9781441909503 (electronic bk.)
020 $a 9781441909497 (paper)
035 $a 978-1-4419-0949-7
050 0 4 $a TK7874.75 $b .M56 2010
082 0 4 $a 621.395 $2 22
090 $a TK7874.75 $b .M665 2010
245 0 0 $a Minimizing and exploiting leakage in VLSI design $h [electronic resource] / $c by Nikhil Jayakumar ... [et al.].
260 $a Boston, MA : $b Springer Science+Business Media, LLC, $c 2010.
300 $a xxvii, 214 p. : $b ill., digital ; $c 24 cm.
650 0 $a Integrated circuits $x Very large scale integration $x Design. $3 257763
650 1 4 $a Engineering. $3 210888
650 2 4 $a Circuits and Systems. $3 274416
650 2 4 $a Computer-Aided Engineering (CAD, CAE) and Design. $3 274500
700 1 $a Jayakumar, Nikhil. $3 485406
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-1-4419-0950-3
950 $a Engineering (Springer-11647)

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EB TK7874.75 .M56 2010

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http://dx.doi.org/10.1007/978-1-4419-0950-3

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