Power-aware testing and test strateg...
Girard, Patrick.

 

  • Power-aware testing and test strategies for low power devices
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Power-aware testing and test strategies for low power devicesedited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen.
    other author: Wen, Xiaoqing.
    Published: Boston, MA :Springer Science+Business Media, LLC,2010.
    Description: 382 p. :ill., digital ;24 cm.
    Contained By: Springer eBooks
    Subject: Low voltage integrated circuitsPower supply.
    Online resource: http://dx.doi.org/10.1007/978-1-4419-0928-2
    ISBN: 9781441909282 (electronic bk.)
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