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Lock-in thermographybasics and use f...

Breitenstein, Otwin.

Lock-in thermographybasics and use for evaluating electronic devices and materials /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Lock-in thermographyby Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
其他題名:	basics and use for evaluating electronic devices and materials /
作者:	Breitenstein, Otwin.
其他作者:	Langenkamp, Martin.
出版者:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2010.
面頁冊數:	x, 255 p. :ill., digital ;24 cm.
叢書名:	Springer series in advanced microelectronics,
Contained By:	Springer eBooks
標題:	Electronic apparatus and appliancesThermal properties.
電子資源:	http://dx.doi.org/10.1007/978-3-642-02417-7
ISBN:	9783642024177 (electronic bk.)

Lock-in thermographybasics and use for evaluating electronic devices and materials /
Breitenstein, Otwin.

Lock-in thermographybasics and use for evaluating electronic devices and materials /[electronic resource] :by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - 2nd ed. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2010. - x, 255 p. :ill., digital ;24 cm. - Springer series in advanced microelectronics,101437-0387 ;.

ISBN: 9783642024177 (electronic bk.)Subjects--Topical Terms:

190372
Electronic apparatus and appliances
--Thermal properties.

LC Class. No.: TK7870.25 / .B74 2010

Dewey Class. No.: 621.381548

Lock-in thermographybasics and use for evaluating electronic devices and materials /
LDR:00935nmm 2200253 a 4500 001 280329
003 Springer
005 20110221095151.0
006 m d
007 cr nn 008maaau
008 110223s2010 gw s j eng d
020 $a 9783642024177 (electronic bk.)
020 $a 9783642024160 (paper)
035 $a 978-3-642-02416-0
050 0 4 $a TK7870.25 $b .B74 2010
082 0 4 $a 621.381548 $2 22
090 $a TK7870.25 $b .B835 2010
100 1 $a Breitenstein, Otwin. $3 492253
245 1 0 $a Lock-in thermography $h [electronic resource] : $b basics and use for evaluating electronic devices and materials / $c by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
250 $a 2nd ed.
260 $a Berlin, Heidelberg : $b Springer-Verlag Berlin Heidelberg, $c 2010.
300 $a x, 255 p. : $b ill., digital ; $c 24 cm.
440 0 $a Springer series in advanced microelectronics, $x 1437-0387 ; $v 10
650 0 $a Electronic apparatus and appliances $x Thermal properties. $3 190372
650 0 $a Electronic apparatus and appliances $x Testing. $3 263596
650 0 $a Semiconductors $x Thermal properties. $3 347364
650 0 $a Thermography. $3 338563
650 1 4 $a Physics. $3 179414
650 2 4 $a Optics, Optoelectronics, Plasmonics and Optical Devices. $3 376501
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Engineering, general. $3 273962
650 2 4 $a Structural Materials. $3 274623
700 1 $a Langenkamp, Martin. $3 492255
700 1 $a Warta, Wilhelm. $3 492254
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-3-642-02417-7
950 $a Engineering (Springer-11647)