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Extreme statistics in nanoscale memo...
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Rutenbar, Rob A.
Extreme statistics in nanoscale memory design
Record Type:
Electronic resources : Monograph/item
Title/Author:
Extreme statistics in nanoscale memory designedited by Amith Singhee, Rob A. Rutenbar.
other author:
Singhee, Amith.
Published:
Boston, MA :Springer Science+Business Media LLC,2010.
Description:
ix, 246 p. :ill., digital ;24 cm.
Series:
Integrated circuits and systems,
Contained By:
Springer eBooks
Subject:
Magnetic memory (Computers)Design.
Online resource:
http://dx.doi.org/10.1007/978-1-4419-6606-3
ISBN:
9781441966063 (electronic bk.)
Extreme statistics in nanoscale memory design
Extreme statistics in nanoscale memory design
[electronic resource] /edited by Amith Singhee, Rob A. Rutenbar. - Boston, MA :Springer Science+Business Media LLC,2010. - ix, 246 p. :ill., digital ;24 cm. - Integrated circuits and systems,1558-9412.
ISBN: 9781441966063 (electronic bk.)Subjects--Topical Terms:
492266
Magnetic memory (Computers)
--Design.
LC Class. No.: TK7895.M3 / E98 2010
Dewey Class. No.: 621.3973
Extreme statistics in nanoscale memory design
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edited by Amith Singhee, Rob A. Rutenbar.
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Springer Science+Business Media LLC,
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000000051715
電子館藏
1圖書
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EB TK7895.M3 E96 2010
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1 records • Pages 1 •
1
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http://dx.doi.org/10.1007/978-1-4419-6606-3
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