Statistical models for test equating...
Davier, Alina A. von.

 

  • Statistical models for test equating, scaling, and linking /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: Statistical models for test equating, scaling, and linking /Alina A. von Davier, editor ; with a foreword by Paul W. Holland.
    other author: Davier, Alina A. von.
    Published: New York, NY :Springer,c2011.
    Description: xix, 367 p. :ill. ;25 cm.
    Subject: ExaminationsScoring
    ISBN: 9780387981376 :
Items
  • 1 records • Pages 1 •
 
320000519720 西方語文圖書區(四樓) 1圖書 一般圖書 LB3060.77 S797 2011 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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