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Reliability of nanoscale circuits an...

Leblebici, Yusuf.

Reliability of nanoscale circuits and systemsmethodologies and circuit architectures /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Reliability of nanoscale circuits and systemsby Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici.
Reminder of title:	methodologies and circuit architectures /
Author:	Stanisavljevic, Milos.
other author:	Schmid, Alexandre.
Published:	New York, NY :Springer Science+Business Media, LLC,2011.
Description:	xxvii, 195 p. :digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Nanoelectromechanical systemsReliability.
Online resource:	http://dx.doi.org/10.1007/978-1-4419-6217-1
ISBN:	9781441962171 (electronic bk.)

Reliability of nanoscale circuits and systemsmethodologies and circuit architectures /
Stanisavljevic, Milos.

Reliability of nanoscale circuits and systemsmethodologies and circuit architectures /[electronic resource] :by Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici. - New York, NY :Springer Science+Business Media, LLC,2011. - xxvii, 195 p. :digital ;24 cm.

ISBN: 9781441962171 (electronic bk.)Subjects--Topical Terms:

509273
Nanoelectromechanical systems
--Reliability.

LC Class. No.: TK7874.84 / .S73 2011

Dewey Class. No.: 621.3815

Reliability of nanoscale circuits and systemsmethodologies and circuit architectures /
LDR:00827nmm 2200229 a 4500 001 292827
003 Springer
005 20110502165820.0
006 m d
007 cr nn 008maaau
008 110816s2011 nyu s j eng d
020 $a 9781441962171 (electronic bk.)
020 $a 9781441962164 (paper)
035 $a 978-1-4419-6216-4
050 0 4 $a TK7874.84 $b .S73 2011
082 0 4 $a 621.3815 $2 22
090 $a TK7874.84 $b .S786 2011
100 1 $a Stanisavljevic, Milos. $3 509272
245 1 0 $a Reliability of nanoscale circuits and systems $h [electronic resource] : $b methodologies and circuit architectures / $c by Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici.
260 $a New York, NY : $b Springer Science+Business Media, LLC, $c 2011.
300 $a xxvii, 195 p. : $b digital ; $c 24 cm.
650 0 $a Nanoelectromechanical systems $x Reliability. $3 509273
650 0 $a Nanoelectronics. $3 308072
650 1 4 $a Engineering. $3 210888
650 2 4 $a Circuits and Systems. $3 274416
650 2 4 $a Quality Control, Reliability, Safety and Risk. $3 274011
650 2 4 $a Computer-Aided Engineering (CAD, CAE) and Design. $3 274500
700 1 $a Schmid, Alexandre. $3 379676
700 1 $a Leblebici, Yusuf. $3 210911
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-1-4419-6217-1
950 $a Engineering (Springer-11647)