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Accelerating test, validation and de...
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Fan, Yongquan.
Accelerating test, validation and debug of high speed serial interfaces
Record Type:
Electronic resources : Monograph/item
Title/Author:
Accelerating test, validation and debug of high speed serial interfacesby Yongquan Fan, Zeljko Zilic.
Author:
Fan, Yongquan.
other author:
Zilic, Zeljko.
Published:
Dordrecht :Springer Science+Business media B.V.,2011.
Description:
xii, 194 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Interface circuitsTesting.
Online resource:
http://dx.doi.org/10.1007/978-90-481-9398-1
ISBN:
9789048193981 (electronic bk.)
Accelerating test, validation and debug of high speed serial interfaces
Fan, Yongquan.
Accelerating test, validation and debug of high speed serial interfaces
[electronic resource] /by Yongquan Fan, Zeljko Zilic. - Dordrecht :Springer Science+Business media B.V.,2011. - xii, 194 p. :ill., digital ;24 cm.
ISBN: 9789048193981 (electronic bk.)Subjects--Topical Terms:
509275
Interface circuits
--Testing.
LC Class. No.: TK7868.I58 / F36 2011
Dewey Class. No.: 621.381548
Accelerating test, validation and debug of high speed serial interfaces
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Fan, Yongquan.
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Accelerating test, validation and debug of high speed serial interfaces
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[electronic resource] /
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by Yongquan Fan, Zeljko Zilic.
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Dordrecht :
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Springer Science+Business media B.V.,
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2011.
300
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xii, 194 p. :
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ill., digital ;
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24 cm.
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Interface circuits
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Very high speed integrated circuits
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Circuits and Systems.
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System Performance and Evaluation.
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Zilic, Zeljko.
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http://dx.doi.org/10.1007/978-90-481-9398-1
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Engineering (Springer-11647)
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000000053775
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1圖書
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EB TK7868.I58 F36 2011
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1 records • Pages 1 •
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http://dx.doi.org/10.1007/978-90-481-9398-1
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