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Nanoscale memory repair

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Horiguchi, Masashi.

Nanoscale memory repair

Record Type:	Electronic resources : Monograph/item
Title/Author:	Nanoscale memory repairby Masashi Horiguchi, Kiyoo Itoh.
Author:	Horiguchi, Masashi.
other author:	Itoh, Kiyoo.
Published:	New York, NY :Springer Science+Business Media, LLC,2011.
Description:	ix, 215 p. :ill., digital ;24 cm.
Series:	Integrated circuits and systems,
Contained By:	Springer eBooks
Subject:	Semiconductor storage devicesepairing.
Online resource:	http://dx.doi.org/10.1007/978-1-4419-7958-2
ISBN:	9781441979582 (electronic bk.)

Nanoscale memory repair
Horiguchi, Masashi.

Nanoscale memory repair[electronic resource] /by Masashi Horiguchi, Kiyoo Itoh. - New York, NY :Springer Science+Business Media, LLC,2011. - ix, 215 p. :ill., digital ;24 cm. - Integrated circuits and systems,1558-9412.

ISBN: 9781441979582 (electronic bk.)Subjects--Topical Terms:

510732
Semiconductor storage devices
--epairing.

LC Class. No.: TK7895.M4 / H67 2011

Dewey Class. No.: 621.39732

Nanoscale memory repair
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003 Springer
005 20110713163246.0
006 m d
007 cr nn 008maaau
008 110816s2011 nyu s j eng d
020 $a 9781441979582 (electronic bk.)
020 $a 9781441979575 (paper)
035 $a 978-1-4419-7957-5
050 0 4 $a TK7895.M4 $b H67 2011
082 0 4 $a 621.39732 $2 22
090 $a TK7895.M4 $b H811 2011
100 1 $a Horiguchi, Masashi. $3 278816
245 1 0 $a Nanoscale memory repair $h [electronic resource] / $c by Masashi Horiguchi, Kiyoo Itoh.
260 $a New York, NY : $b Springer Science+Business Media, LLC, $c 2011.
300 $a ix, 215 p. : $b ill., digital ; $c 24 cm.
440 0 $a Integrated circuits and systems, $x 1558-9412
650 0 $a Semiconductor storage devices $x epairing. $3 510732
650 1 4 $a Engineering. $3 210888
650 2 4 $a Circuits and Systems. $3 274416
650 2 4 $a Computer-Aided Engineering (CAD, CAE) and Design. $3 274500
700 1 $a Itoh, Kiyoo. $3 260687
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-1-4419-7958-2
950 $a Engineering (Springer-11647)

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EB TK7895.M4 H67 2011

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http://dx.doi.org/10.1007/978-1-4419-7958-2

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