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Reliability of microtechnologyinterc...
~
Liu, Johan.
Reliability of microtechnologyinterconnects, devices and systems /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Reliability of microtechnologyby Johan Liu ... [et al.].
Reminder of title:
interconnects, devices and systems /
other author:
Liu, Johan.
Published:
New York, NY :Springer Science+Business Media, LLC,2011.
Description:
xiii, 204 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
MicrotechnologyReliability.
Online resource:
http://dx.doi.org/10.1007/978-1-4419-5760-3
ISBN:
9781441957603 (electronic bk.)
Reliability of microtechnologyinterconnects, devices and systems /
Reliability of microtechnology
interconnects, devices and systems /[electronic resource] :by Johan Liu ... [et al.]. - New York, NY :Springer Science+Business Media, LLC,2011. - xiii, 204 p. :ill., digital ;24 cm.
ISBN: 9781441957603 (electronic bk.)Subjects--Topical Terms:
511182
Microtechnology
--Reliability.
LC Class. No.: TK7835 / .R45 2011
Dewey Class. No.: 621.381
Reliability of microtechnologyinterconnects, devices and systems /
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interconnects, devices and systems /
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by Johan Liu ... [et al.].
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Springer Science+Business Media, LLC,
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24 cm.
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Microtechnology
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Engineering (Springer-11647)
based on 0 review(s)
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電子館藏
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1 records • Pages 1 •
1
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000000054866
電子館藏
1圖書
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EB TK7835 .R45 2011
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1 records • Pages 1 •
1
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http://dx.doi.org/10.1007/978-1-4419-5760-3
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