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Modern approaches in applied intelli...

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Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Modern approaches in applied intelligenceedited by Kishan G. Mehrotra ... [et al.].
Reminder of title:	24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.
remainder title:	IEA/AIE 2011
other author:	Mehrotra, Kishan G.
corporate name:
Published:	Berlin, Heidelberg :Springer-Verlag GmbH Berlin Heidelberg,2011.
Description:	xx, 581 p. :ill., digital ;24 cm.
Series:	Lecture notes in computer science,
Contained By:	Springer eBooks
Subject:	Artificial intelligenceCongresses.Industrial applications
Online resource:	http://dx.doi.org/10.1007/978-3-642-21827-9
ISBN:	9783642218279 (electronic bk.)

Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /
Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /[electronic resource] :IEA/AIE 2011edited by Kishan G. Mehrotra ... [et al.]. - Berlin, Heidelberg :Springer-Verlag GmbH Berlin Heidelberg,2011. - xx, 581 p. :ill., digital ;24 cm. - Lecture notes in computer science,67040302-9743 ;.

ISBN: 9783642218279 (electronic bk.)Subjects--Topical Terms:

439227
Artificial intelligence
--Industrial applications--Congresses.

LC Class. No.: Q334 / .I58 2011

Dewey Class. No.: 006.3

Modern approaches in applied intelligence24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /
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