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人工智慧自動化測試機界面 = Artificial intelligen...

劉珀祥

人工智慧自動化測試機界面 = Artificial intelligence automated tester interface

Record Type:	Language materials, printed : monographic
Paralel Title:	Artificial intelligence automated tester interface
Author:	劉珀祥,
Secondary Intellectual Responsibility:	國立高雄大學
Place of Publication:	[高雄市]
Published:	撰者;
Year of Publication:	民100
Description:	62葉圖，表格 : 30公分;
Subject:	人工智慧
Subject:	Artificial intelligence
Online resource:	http://handle.ncl.edu.tw/11296/ndltd/41761913701062795538
Notes:	參考書目：葉52-53
Summary:	本文將介紹以人工智慧產生IC測試機台之測試執行碼轉譯界面，工程師只需輸入相關的IC測試條件及參數，透過此界面可以判別IC測試的環境及條件是否符合測試規範，此界面利用LabVIEW優越的外部週邊設備控制功能以及透過GCC編譯器將Make檔編譯為可執行檔以執行測試程式，最後顯示測試統計結果以供測試的效能分析，可大幅縮短IC測試的開發時間和人力以縮短工作週期，可以提升IC測試的效能。 This paper demonstrate an interface of automatic generation of the IC testing codes by using artificial intelligent algorism based on LabVIEW peripheral interface control programming environment. This interface can generate correct codes for an IC testing engineer by only input minimum related test conditions and test parameters. At the same time, it will compile Make file to executable file with GCC compiler and run the testing program. Finally, test result and related test time will be displayed for determination and analysis. In addition, an execution run file for IC testing can be made to minimize the batch file time. This intelligent interface for IC testing can effectively minimize the testing cost and improve the efficiency for IC testing industry.

人工智慧自動化測試機界面 = Artificial intelligence automated tester interface
劉, 珀祥

人工智慧自動化測試機界面 = Artificial intelligence automated tester interface / 劉珀祥撰 - [高雄市] : 撰者, 民100. - 62葉 ; 圖，表格 ; 30公分.
參考書目：葉52-53.
人工智慧Artificial intelligence

人工智慧自動化測試機界面 = Artificial intelligence automated tester interface
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328 $a 碩士論文--國立高雄大學電機工程學系碩士班
330 $a 本文將介紹以人工智慧產生IC測試機台之測試執行碼轉譯界面，工程師只需輸入相關的IC測試條件及參數，透過此界面可以判別IC測試的環境及條件是否符合測試規範，此界面利用LabVIEW優越的外部週邊設備控制功能以及透過GCC編譯器將Make檔編譯為可執行檔以執行測試程式，最後顯示測試統計結果以供測試的效能分析，可大幅縮短IC測試的開發時間和人力以縮短工作週期，可以提升IC測試的效能。 This paper demonstrate an interface of automatic generation of the IC testing codes by using artificial intelligent algorism based on LabVIEW peripheral interface control programming environment. This interface can generate correct codes for an IC testing engineer by only input minimum related test conditions and test parameters. At the same time, it will compile Make file to executable file with GCC compiler and run the testing program. Finally, test result and related test time will be displayed for determination and analysis. In addition, an execution run file for IC testing can be made to minimize the batch file time. This intelligent interface for IC testing can effectively minimize the testing cost and improve the efficiency for IC testing industry.
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