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Microelectronic test structures for ...

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Bhushan, Manjul.

Microelectronic test structures for CMOS technology

Record Type:	Electronic resources : Monograph/item
Title/Author:	Microelectronic test structures for CMOS technologyby Manjul Bhushan, Mark B. Ketchen.
Author:	Bhushan, Manjul.
other author:	Ketchen, Mark B.
Published:	New York, NY :Springer Science+Business Media, LLC,2011.
Description:	xxxiv, 373 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Metal oxide semiconductors, ComplementaryTesting.
Online resource:	http://dx.doi.org/10.1007/978-1-4419-9377-9
ISBN:	9781441993779 (electronic bk.)

Microelectronic test structures for CMOS technology
Bhushan, Manjul.

Microelectronic test structures for CMOS technology[electronic resource] /by Manjul Bhushan, Mark B. Ketchen. - New York, NY :Springer Science+Business Media, LLC,2011. - xxxiv, 373 p. :ill., digital ;24 cm.

ISBN: 9781441993779 (electronic bk.)Subjects--Topical Terms:

524515
Metal oxide semiconductors, Complementary
--Testing.

LC Class. No.: TK7871.99.M44 / B48 2011

Dewey Class. No.: 621.38152

Microelectronic test structures for CMOS technology
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100 1 $a Bhushan, Manjul. $3 524513
245 1 0 $a Microelectronic test structures for CMOS technology $h [electronic resource] / $c by Manjul Bhushan, Mark B. Ketchen.
260 $a New York, NY : $b Springer Science+Business Media, LLC, $c 2011.
300 $a xxxiv, 373 p. : $b ill., digital ; $c 24 cm.
650 0 $a Metal oxide semiconductors, Complementary $x Testing. $3 524515
650 1 4 $a Engineering. $3 210888
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 274412
650 2 4 $a Optical and Electronic Materials. $3 274099
650 2 4 $a Circuits and Systems. $3 274416
700 1 $a Ketchen, Mark B. $3 524514
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856 4 0 $u http://dx.doi.org/10.1007/978-1-4419-9377-9
950 $a Engineering (Springer-11647)

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EB TK7871.99.M44 B575 2011

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http://dx.doi.org/10.1007/978-1-4419-9377-9

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