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Life-cycle assessment of semiconductors
~
Boyd, Sarah B.
Life-cycle assessment of semiconductors
Record Type:
Electronic resources : Monograph/item
Title/Author:
Life-cycle assessment of semiconductorsby Sarah B. Boyd.
Author:
Boyd, Sarah B.
Published:
New York, NY :Springer Science+Business Media, LLC,2012.
Description:
xxvii, 226 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Product life cycle.
Online resource:
http://dx.doi.org/10.1007/978-1-4419-9988-7
ISBN:
9781441999887 (electronic bk.)
Life-cycle assessment of semiconductors
Boyd, Sarah B.
Life-cycle assessment of semiconductors
[electronic resource] /by Sarah B. Boyd. - New York, NY :Springer Science+Business Media, LLC,2012. - xxvii, 226 p. :ill., digital ;24 cm.
ISBN: 9781441999887 (electronic bk.)Subjects--Topical Terms:
197255
Product life cycle.
LC Class. No.: TK7871.85 / .B69 2012
Dewey Class. No.: 621.38152
Life-cycle assessment of semiconductors
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by Sarah B. Boyd.
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New York, NY :
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Springer Science+Business Media, LLC,
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2012.
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xxvii, 226 p. :
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ill., digital ;
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24 cm.
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Product life cycle.
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Engineering.
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Electronics and Microelectronics, Instrumentation.
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Semiconductors.
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http://dx.doi.org/10.1007/978-1-4419-9988-7
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Engineering (Springer-11647)
based on 0 review(s)
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000000066712
電子館藏
1圖書
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EB TK7871.85 .B789 2012
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1 records • Pages 1 •
1
Multimedia
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http://dx.doi.org/10.1007/978-1-4419-9988-7
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