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Process variations and probabilistic...
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Dietrich, Manfred.
Process variations and probabilistic integrated circuit design
Record Type:
Electronic resources : Monograph/item
Title/Author:
Process variations and probabilistic integrated circuit designedited by Manfred Dietrich, Joachim Haase.
other author:
Dietrich, Manfred.
Published:
New York, NY :Springer Science+Business Media, LLC,2012.
Description:
xvi, 249 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Integrated circuitsDesign and construction.
Online resource:
http://dx.doi.org/10.1007/978-1-4419-6621-6
ISBN:
9781441966216 (electronic bk.)
Process variations and probabilistic integrated circuit design
Process variations and probabilistic integrated circuit design
[electronic resource] /edited by Manfred Dietrich, Joachim Haase. - New York, NY :Springer Science+Business Media, LLC,2012. - xvi, 249 p. :ill., digital ;24 cm.
ISBN: 9781441966216 (electronic bk.)Subjects--Topical Terms:
184690
Integrated circuits
--Design and construction.
LC Class. No.: TK7874 / .P76 2012
Dewey Class. No.: 621.3815
Process variations and probabilistic integrated circuit design
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Dietrich, Manfred.
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Haase, Joachim.
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Engineering (Springer-11647)
based on 0 review(s)
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000000066937
電子館藏
1圖書
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EB TK7874 .P963 2012
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1 records • Pages 1 •
1
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http://dx.doi.org/10.1007/978-1-4419-6621-6
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