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High quality test pattern generation...
~
Drechsler, Rolf.
High quality test pattern generation and boolean satisfiability
Record Type:
Electronic resources : Monograph/item
Title/Author:
High quality test pattern generation and boolean satisfiabilityby Stephan EggersgluB, Rolf Drechsler.
Author:
Eggersgluss, Stephan.
other author:
Drechsler, Rolf.
Published:
Boston, MA :Springer US,2012.
Description:
xviii, 193 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Integrated circuitsTesting.
Online resource:
http://dx.doi.org/10.1007/978-1-4419-9976-4
ISBN:
9781441999764 (electronic bk.)
High quality test pattern generation and boolean satisfiability
Eggersgluss, Stephan.
High quality test pattern generation and boolean satisfiability
[electronic resource] /by Stephan EggersgluB, Rolf Drechsler. - Boston, MA :Springer US,2012. - xviii, 193 p. :ill., digital ;24 cm.
ISBN: 9781441999764 (electronic bk.)Subjects--Topical Terms:
181932
Integrated circuits
--Testing.
LC Class. No.: TK7874 / .E34 2012
Dewey Class. No.: 621.395
High quality test pattern generation and boolean satisfiability
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by Stephan EggersgluB, Rolf Drechsler.
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Springer US,
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xviii, 193 p. :
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Integrated circuits
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Engineering (Springer-11647)
based on 0 review(s)
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000000067546
電子館藏
1圖書
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EB TK7874 .E29 2012
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1 records • Pages 1 •
1
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http://dx.doi.org/10.1007/978-1-4419-9976-4
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