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Characterization of microstructures ...
~
Rong, Yonghua.
Characterization of microstructures by analytical electron microscopy (AEM)
Record Type:
Electronic resources : Monograph/item
Title/Author:
Characterization of microstructures by analytical electron microscopy (AEM)by Yonghua Rong.
Author:
Rong, Yonghua.
Published:
Berlin, Heidelberg :Springer Berlin Heidelberg,2012.
Description:
xviii, 552 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Nanostructured materialsNondestructive testing.
Online resource:
http://dx.doi.org/10.1007/978-3-642-20119-6
ISBN:
9783642201196 (electronic bk.)
Characterization of microstructures by analytical electron microscopy (AEM)
Rong, Yonghua.
Characterization of microstructures by analytical electron microscopy (AEM)
[electronic resource] /by Yonghua Rong. - Berlin, Heidelberg :Springer Berlin Heidelberg,2012. - xviii, 552 p. :ill., digital ;24 cm.
ISBN: 9783642201196 (electronic bk.)Subjects--Topical Terms:
561514
Nanostructured materials
--Nondestructive testing.
LC Class. No.: TA417.23 / .R66 2012
Dewey Class. No.: 620.1157
Characterization of microstructures by analytical electron microscopy (AEM)
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by Yonghua Rong.
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xviii, 552 p. :
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Chemistry and Materials Science (Springer-11644)
based on 0 review(s)
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EB TA417.23 .R773 2012
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http://dx.doi.org/10.1007/978-3-642-20119-6
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