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Atom probe microscopy

Gault, Baptiste.

Atom probe microscopy

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Atom probe microscopyby Baptiste Gault... [et al.].
其他作者:	Gault, Baptiste.
出版者:	New York, NY :Springer New York :2012.
面頁冊數:	xxiii, 396 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
標題:	Atomic force microscopy.
電子資源:	http://dx.doi.org/10.1007/978-1-4614-3436-8
ISBN:	9781461434368 (electronic bk.)

Atom probe microscopy
Atom probe microscopy[electronic resource] /by Baptiste Gault... [et al.]. - New York, NY :Springer New York :2012. - xxiii, 396 p. :ill., digital ;24 cm. - Springer series in materials science,1600933-033X ;. - Springer series in materials science ;v. 62..

ISBN: 9781461434368 (electronic bk.)Subjects--Topical Terms:

189132
Atomic force microscopy.

LC Class. No.: QH212.A78 / A866 2012

Dewey Class. No.: 620.5

Atom probe microscopy
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650 0 $a Scanning probe microscopy. $3 189049
650 0 $a Atom-probe field ion microscopy. $3 572949
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650 2 4 $a Characterization and Evaluation of Materials. $3 273978
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650 2 4 $a Nanochemistry. $3 264782
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