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Atom probe microscopy
~
Gault, Baptiste.
Atom probe microscopy
Record Type:
Electronic resources : Monograph/item
Title/Author:
Atom probe microscopyby Baptiste Gault... [et al.].
other author:
Gault, Baptiste.
Published:
New York, NY :Springer New York :2012.
Description:
xxiii, 396 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Atomic force microscopy.
Online resource:
http://dx.doi.org/10.1007/978-1-4614-3436-8
ISBN:
9781461434368 (electronic bk.)
Atom probe microscopy
Atom probe microscopy
[electronic resource] /by Baptiste Gault... [et al.]. - New York, NY :Springer New York :2012. - xxiii, 396 p. :ill., digital ;24 cm. - Springer series in materials science,1600933-033X ;. - Springer series in materials science ;v. 62..
ISBN: 9781461434368 (electronic bk.)Subjects--Topical Terms:
189132
Atomic force microscopy.
LC Class. No.: QH212.A78 / A866 2012
Dewey Class. No.: 620.5
Atom probe microscopy
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by Baptiste Gault... [et al.].
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Scanning probe microscopy.
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Atom-probe field ion microscopy.
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Characterization and Evaluation of Materials.
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Gault, Baptiste.
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Chemistry and Materials Science (Springer-11644)
based on 0 review(s)
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1
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000000070834
電子館藏
1圖書
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EB QH212.A78 A866 2012
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1 records • Pages 1 •
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http://dx.doi.org/10.1007/978-1-4614-3436-8
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