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Scanning electron microscope optics ...
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Khursheed, Anjam.
Scanning electron microscope optics and spectrometers
Record Type:
Electronic resources : Monograph/item
Title/Author:
Scanning electron microscope optics and spectrometersAnjam Khursheed.
Author:
Khursheed, Anjam.
Published:
Singapore ;World Scientific Pub. Co.,c2011.
Description:
xiii, 402 p. :ill. (some col.)
Subject:
Scanning electron microscopesDesign and construction.
Online resource:
http://www.worldscientific.com/worldscibooks/10.1142/7094#t=toc
ISBN:
9789812836687 (electronic bk.)
Scanning electron microscope optics and spectrometers
Khursheed, Anjam.
Scanning electron microscope optics and spectrometers
[electronic resource] /Anjam Khursheed. - Singapore ;World Scientific Pub. Co.,c2011. - xiii, 402 p. :ill. (some col.)
Includes bibliographical references (p. 385-398) and index.
This book contains proposals to redesign the scanning electron microscope so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself. The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.
Electronic reproduction.
Singapore :
World Scientific Publishing Co.,
2011.
System requirements: Adobe Acrobat Reader.
ISBN: 9789812836687 (electronic bk.)Subjects--Topical Terms:
575166
Scanning electron microscopes
--Design and construction.
LC Class. No.: QH212.S3
Dewey Class. No.: 502.825
Scanning electron microscope optics and spectrometers
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Includes bibliographical references (p. 385-398) and index.
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This book contains proposals to redesign the scanning electron microscope so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself. The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.
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2011.
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http://www.worldscientific.com/worldscibooks/10.1142/7094#t=toc
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EB QH212.S3 c2011
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http://www.worldscientific.com/worldscibooks/10.1142/7094#t=toc
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