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Handbook of instrumentation and tech...

Haight, Richard.

Handbook of instrumentation and techniques for semiconductor nanostructure characterization

Record Type:	Electronic resources : Monograph/item
Title/Author:	Handbook of instrumentation and techniques for semiconductor nanostructure characterizationeditors, Richard Haight, Frances M. Ross, James B. Hannon.
other author:	Haight, Richard.
Published:	Singapore ;World Scientific Pub. Co.,c2012.
Description:	xxiv, [321] p. :ill. (some col.)
Subject:	Nanostructured materialsCongresses.
Online resource:	Volume 1 & 2
ISBN:	9789814322843 (electronic bk.)

Handbook of instrumentation and techniques for semiconductor nanostructure characterization
Handbook of instrumentation and techniques for semiconductor nanostructure characterization[electronic resource] /editors, Richard Haight, Frances M. Ross, James B. Hannon. - Singapore ;World Scientific Pub. Co.,c2012. - xxiv, [321] p. :ill. (some col.) - World Scientific series in materials and energy ;1-2. - World Scientific series in materials and energy ;1-2..

Includes bibliographical references and index.

As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.

Electronic reproduction.
Singapore :
World Scientific Publishing Co.,
2012.

System requirements: Adobe Acrobat Reader.

ISBN: 9789814322843 (electronic bk.)Subjects--Topical Terms:

438612
Nanostructured materials
--Congresses.

LC Class. No.: TA418.9.N35

Dewey Class. No.: 620.5

Handbook of instrumentation and techniques for semiconductor nanostructure characterization
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245 0 0 $a Handbook of instrumentation and techniques for semiconductor nanostructure characterization $h [electronic resource] / $c editors, Richard Haight, Frances M. Ross, James B. Hannon.
260 $a Singapore ; $a Hackensack, N.J. : $b World Scientific Pub. Co., $c c2012.
300 $a xxiv, [321] p. : $b ill. (some col.)
490 1 $a World Scientific series in materials and energy ; $v 1-2
504 $a Includes bibliographical references and index.
520 $a As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
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700 1 $a Ross, Frances M. $3 575228
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