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Characterization and behavior of int...
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(1998 :)
Characterization and behavior of interfacesproceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Characterization and behavior of interfacesedited by J. David Frost.
Reminder of title:
proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /
other author:
Frost, J. David.
corporate name:
Published:
Amsterdam ;IOS Press,c2010.
Description:
x, 155 p. :ill. ;25 cm.
Subject:
Engineering geology
Online resource:
http://ebooks.windeal.com.tw/ios/cover.asp?isbn=9781607504900
ISBN:
9781607504917 (electronic bk.)
Characterization and behavior of interfacesproceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /
Characterization and behavior of interfaces
proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /[electronic resource] :edited by J. David Frost. - Amsterdam ;IOS Press,c2010. - x, 155 p. :ill. ;25 cm.
Includes bibliographical references and indexes.
ISBN: 9781607504917 (electronic bk.)
LCCN: 2010920778Subjects--Topical Terms:
254792
Engineering geology
LC Class. No.: TA703.5 / .R47 2008
Dewey Class. No.: 624.151
Characterization and behavior of interfacesproceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /
LDR
:00880cmm a2200205 a 45
001
350534
005
20121024140911.0
008
121206s2010 ne a sb 101 0 eng d
010
$a
2010920778
020
$a
9781607504917 (electronic bk.)
020
$a
9781607504900
035
$a
(OCoLC)ocn567148848
035
$a
00000752
040
$a
BTCTA
$b
eng
$c
BTCTA
$d
YDXCP
$d
BWX
$d
TXA
$d
CDX
$d
DLC
050
0 0
$a
TA703.5
$b
.R47 2008
082
0 4
$a
624.151
$2
22
111
2
$n
(3rd :
$d
1998 :
$c
Amsterdam, Netherlands)
$3
194767
245
1 0
$a
Characterization and behavior of interfaces
$h
[electronic resource] :
$b
proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA /
$c
edited by J. David Frost.
260
$a
Amsterdam ;
$a
Fairfax, VA :
$b
IOS Press,
$c
c2010.
300
$a
x, 155 p. :
$b
ill. ;
$c
25 cm.
504
$a
Includes bibliographical references and indexes.
650
0
$a
Engineering geology
$3
254792
650
0
$a
Surfaces (Technology)
$3
190551
700
1
$a
Frost, J. David.
$3
582703
710
2
$a
Georgia Institute of Technology.
$3
212511
856
4
$u
http://ebooks.windeal.com.tw/ios/cover.asp?isbn=9781607504900
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EB TA703.5 R47 2008 c2010
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http://ebooks.windeal.com.tw/ios/cover.asp?isbn=9781607504900
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