Language:
English
繁體中文
Help
圖資館首頁
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Electromagnetic nondestructive evalu...
~
(1998 :)
Electromagnetic nondestructive evaluation (XII)
Record Type:
Electronic resources : Monograph/item
Title/Author:
Electromagnetic nondestructive evaluation (XII)edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song.
other author:
Shin, Young-Kil.
corporate name:
Published:
Amsterdam :IOS Press ;c2009.
Description:
xxvii, 416 p. :ill. ;25 cm.
Subject:
Magnetic testingCongresses.
Online resource:
http://ebooks.windeal.com.tw/ios/cover.asp?isbn=9781607500230
ISBN:
9781607504429 (electronic bk.)
Electromagnetic nondestructive evaluation (XII)
Electromagnetic nondestructive evaluation (XII)
[electronic resource] /edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song. - Amsterdam :IOS Press ;c2009. - xxvii, 416 p. :ill. ;25 cm. - Studies in applied electromagnetics and mechanics,v. 321383-7281 ;. - Studies in applied electromagnetics and mechanics ;28.
Includes bibliographical references and indexes.
ISBN: 9781607504429 (electronic bk.)
LCCN: 2009904437Subjects--Topical Terms:
444246
Magnetic testing
--Congresses.Subjects--Index Terms:
Nondestructive evaluation
LC Class. No.: TA417.3 / .E486 2008
Dewey Class. No.: 620.1/1278
Electromagnetic nondestructive evaluation (XII)
LDR
:00965cmm a22002417a 4500
001
393381
005
20131009142220.0
008
131206s2009 enka sb 101 0 eng c
010
$a
2009904437
020
$a
9781607504429 (electronic bk.)
020
$a
9781607500230
035
$a
(OCoLC)ocn441170870
035
$a
13000360
040
$a
UKM
$c
UKM
$d
BTCTA
$d
BWX
$d
YDXCP
$d
TXA
$d
DLC
042
$a
pcc
$a
ukblsr
050
0 0
$a
TA417.3
$b
.E486 2008
082
0 0
$a
620.1/1278
$2
22
111
2
$n
(3rd :
$d
1998 :
$c
Amsterdam, Netherlands)
$3
194767
245
1 0
$a
Electromagnetic nondestructive evaluation (XII)
$h
[electronic resource] /
$c
edited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song.
260
$a
Amsterdam :
$a
Washington, DC :
$b
IOS Press ;
$a
Lancaster :
$b
Gazelle Books Services [distributor],
$c
c2009.
300
$a
xxvii, 416 p. :
$b
ill. ;
$c
25 cm.
490
1
$a
Studies in applied electromagnetics and mechanics,
$x
1383-7281 ;
$v
v. 32
504
$a
Includes bibliographical references and indexes.
650
0
$a
Magnetic testing
$v
Congresses.
$3
444246
650
0
$a
Electromagnetic measurements
$v
Congresses.
$3
483402
653
1
$a
Nondestructive evaluation
700
1
$a
Shin, Young-Kil.
$3
618752
700
1
$a
Lee, Hyang-Beom.
$3
618753
700
1
$a
Song, Sung-Jin.
$3
618754
830
0
$a
Studies in applied electromagnetics and mechanics ;
$v
28
$3
444244
856
4 0
$u
http://ebooks.windeal.com.tw/ios/cover.asp?isbn=9781607500230
based on 0 review(s)
ALL
電子館藏
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
000000087002
電子館藏
1圖書
電子書
EB TA417.3 E486 2008 c2009
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Multimedia file
http://ebooks.windeal.com.tw/ios/cover.asp?isbn=9781607500230
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login