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Trace-based post-silicon validation ...
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Liu, Xiao.
Trace-based post-silicon validation for VLSI circuits
Record Type:
Electronic resources : Monograph/item
Title/Author:
Trace-based post-silicon validation for VLSI circuitsby Xiao Liu, Qiang Xu.
Author:
Liu, Xiao.
other author:
Xu, Qiang.
Published:
Cham ;Springer International Publishing :2014.
Description:
xv, 108 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Integrated circuitsVery large scale integration
Online resource:
http://dx.doi.org/10.1007/978-3-319-00533-1
ISBN:
9783319005331 (electronic bk.)
Trace-based post-silicon validation for VLSI circuits
Liu, Xiao.
Trace-based post-silicon validation for VLSI circuits
[electronic resource] /by Xiao Liu, Qiang Xu. - Cham ;Springer International Publishing :2014. - xv, 108 p. :ill., digital ;24 cm. - Lecture notes in electrical engineering ;252. - Lecture notes in electrical engineering ;v.132..
ISBN: 9783319005331 (electronic bk.)Subjects--Topical Terms:
182089
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874 / .L58 2014
Dewey Class. No.: 621.395
Trace-based post-silicon validation for VLSI circuits
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Engineering (Springer-11647)
based on 0 review(s)
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000000094667
電子館藏
1圖書
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EB TK7874 L783 2014
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1 records • Pages 1 •
1
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http://dx.doi.org/10.1007/978-3-319-00533-1
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