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Reliability of high mobility SiGe ch...

Franco, Jacopo.

Reliability of high mobility SiGe channel MOSFETs for future CMOS applications

Record Type:	Electronic resources : Monograph/item
Title/Author:	Reliability of high mobility SiGe channel MOSFETs for future CMOS applicationsby Jacopo Franco, Ben Kaczer, Guido Groeseneken.
Author:	Franco, Jacopo.
other author:	Kaczer, Ben.
Published:	Dordrecht :Springer Netherlands :2014.
Description:	xix, 187 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Metal oxide semiconductor field-effect transistorsReliability.
Online resource:	http://dx.doi.org/10.1007/978-94-007-7663-0
ISBN:	9789400776630 (electronic bk.)

Reliability of high mobility SiGe channel MOSFETs for future CMOS applications
Franco, Jacopo.

Reliability of high mobility SiGe channel MOSFETs for future CMOS applications[electronic resource] /by Jacopo Franco, Ben Kaczer, Guido Groeseneken. - Dordrecht :Springer Netherlands :2014. - xix, 187 p. :ill., digital ;24 cm. - Springer Series in Advanced Microelectronics,v.471437-0387 ;. - Springer series in advanced microelectronics ;3..

ISBN: 9789400776630 (electronic bk.)Subjects--Topical Terms:

676153
Metal oxide semiconductor field-effect transistors
--Reliability.

Dewey Class. No.: 621.3815284

Reliability of high mobility SiGe channel MOSFETs for future CMOS applications
LDR:00897nmm a2200253 a 4500 001 432021
003 DE-He213
005 20140513152855.0
006 m d
007 cr nn 008maaau
008 141114s2014 ne s 0 eng d
020 $a 9789400776630 (electronic bk.)
020 $a 9789400776623 (paper)
035 $a 978-94-007-7663-0
040 $a GP $c GP
041 0 $a eng
082 0 4 $a 621.3815284 $2 23
090 $a TK7871.95 $b .F825 2014
100 1 $a Franco, Jacopo. $3 676150
245 1 0 $a Reliability of high mobility SiGe channel MOSFETs for future CMOS applications $h [electronic resource] / $c by Jacopo Franco, Ben Kaczer, Guido Groeseneken.
260 $a Dordrecht : $b Springer Netherlands : $b Imprint: Springer, $c 2014.
300 $a xix, 187 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer Series in Advanced Microelectronics, $x 1437-0387 ; $v v.47
650 0 $a Metal oxide semiconductor field-effect transistors $x Reliability. $3 676153
650 0 $a Metal oxide semiconductors, Complementary $x Reliability. $3 676154
650 1 4 $a Physics. $3 179414
650 2 4 $a Semiconductors. $3 182134
650 2 4 $a Circuits and Systems. $3 274416
650 2 4 $a Optical and Electronic Materials. $3 274099
650 2 4 $a Electronic Circuits and Devices. $3 495609
700 1 $a Kaczer, Ben. $3 676151
700 1 $a Groeseneken, Guido. $3 676152
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer series in advanced microelectronics ; $v 3. $3 444554
856 4 0 $u http://dx.doi.org/10.1007/978-94-007-7663-0
950 $a Engineering (Springer-11647)