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Debug automation from pre-silicon to...

Dehbashi, Mehdi.

Debug automation from pre-silicon to post-silicon

Record Type:	Electronic resources : Monograph/item
Title/Author:	Debug automation from pre-silicon to post-siliconby Mehdi Dehbashi, Gorschwin Fey.
Author:	Dehbashi, Mehdi.
other author:	Fey, Gorschwin.
Published:	Cham :Springer International Publishing :2015.
Description:	xiv, 171 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Integrated circuitsVery large scale integration
Online resource:	http://dx.doi.org/10.1007/978-3-319-09309-3
ISBN:	9783319093093 (electronic bk.)

Debug automation from pre-silicon to post-silicon
Dehbashi, Mehdi.

Debug automation from pre-silicon to post-silicon[electronic resource] /by Mehdi Dehbashi, Gorschwin Fey. - Cham :Springer International Publishing :2015. - xiv, 171 p. :ill. (some col.), digital ;24 cm.

Introduction -- Preliminaries -- Part I Debug of Design Bugs -- Automated Debugging for Logic Bugs -- Automated Debugging from Pre-Silicon to Post-Silicon -- Automated Debugging for Synchronization Bugs -- Part II Debug of Delay Faults -- Analyzing Timing Variations -- Automated Debugging for Timing Variations -- Efficient Automated Speedpath Debugging -- Part III Debug of Transactions -- Online Debug for NoC-Based Multiprocessor SoCs -- Summary and Outlook.

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

ISBN: 9783319093093 (electronic bk.)

Standard No.: 10.1007/978-3-319-09309-3doiSubjects--Topical Terms:

182401
Integrated circuits
--Very large scale integration

LC Class. No.: TK7874.75

Dewey Class. No.: 621.395

Debug automation from pre-silicon to post-silicon
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245 1 0 $a Debug automation from pre-silicon to post-silicon $h [electronic resource] / $c by Mehdi Dehbashi, Gorschwin Fey.
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505 0 $a Introduction -- Preliminaries -- Part I Debug of Design Bugs -- Automated Debugging for Logic Bugs -- Automated Debugging from Pre-Silicon to Post-Silicon -- Automated Debugging for Synchronization Bugs -- Part II Debug of Delay Faults -- Analyzing Timing Variations -- Automated Debugging for Timing Variations -- Efficient Automated Speedpath Debugging -- Part III Debug of Transactions -- Online Debug for NoC-Based Multiprocessor SoCs -- Summary and Outlook.
520 $a This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
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