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X-ray absorption spectroscopy of sem...

Ridgway, Mark C.

X-ray absorption spectroscopy of semiconductors

Record Type:	Electronic resources : Monograph/item
Title/Author:	X-ray absorption spectroscopy of semiconductorsedited by Claudia S. Schnohr, Mark C. Ridgway.
other author:	Schnohr, Claudia S.
Published:	Berlin, Heidelberg :Springer Berlin Heidelberg :2015.
Description:	xvi, 361 p. :ill. (some col.), digital ;24 cm.
Contained By:	Springer eBooks
Subject:	SemiconductorsTesting.
Online resource:	http://dx.doi.org/10.1007/978-3-662-44362-0
ISBN:	9783662443620 (electronic bk.)

X-ray absorption spectroscopy of semiconductors
X-ray absorption spectroscopy of semiconductors[electronic resource] /edited by Claudia S. Schnohr, Mark C. Ridgway. - Berlin, Heidelberg :Springer Berlin Heidelberg :2015. - xvi, 361 p. :ill. (some col.), digital ;24 cm. - Springer series in optical sciences,v.1900342-4111 ;. - Springer series in optical sciences ;v. 93..

Introduction to XAS -- Crystalline Semiconductors -- Disordered Semiconductors.-- Nanostructures -- Magnetic Semiconductors.

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

ISBN: 9783662443620 (electronic bk.)

Standard No.: 10.1007/978-3-662-44362-0doiSubjects--Topical Terms:

200391
Semiconductors
--Testing.

LC Class. No.: TK7871.85

Dewey Class. No.: 621.31852

X-ray absorption spectroscopy of semiconductors
LDR:02586nmm a2200325 a 4500 001 460907
003 DE-He213
005 20150721160621.0
006 m d
007 cr nn 008maaau
008 151110s2015 gw s 0 eng d
020 $a 9783662443620 (electronic bk.)
020 $a 9783662443613 (paper)
024 7 $a 10.1007/978-3-662-44362-0 $2 doi
035 $a 978-3-662-44362-0
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7871.85
072 7 $a TJFD5 $2 bicssc
072 7 $a TEC008090 $2 bisacsh
082 0 4 $a 621.31852 $2 23
090 $a TK7871.85 $b .X1 2015
245 0 0 $a X-ray absorption spectroscopy of semiconductors $h [electronic resource] / $c edited by Claudia S. Schnohr, Mark C. Ridgway.
260 $a Berlin, Heidelberg : $b Springer Berlin Heidelberg : $b Imprint: Springer, $c 2015.
300 $a xvi, 361 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a Springer series in optical sciences, $x 0342-4111 ; $v v.190
505 0 $a Introduction to XAS -- Crystalline Semiconductors -- Disordered Semiconductors.-- Nanostructures -- Magnetic Semiconductors.
520 $a X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
650 0 $a Semiconductors $x Testing. $3 200391
650 0 $a X-rays $x Industrial applications. $3 675627
650 0 $a X-ray spectroscopy. $3 188603
650 1 4 $a Physics. $3 179414
650 2 4 $a Semiconductors. $3 182134
650 2 4 $a Optical and Electronic Materials. $3 274099
650 2 4 $a Spectroscopy and Microscopy. $3 376485
650 2 4 $a Characterization and Evaluation of Materials. $3 273978
650 2 4 $a Applied and Technical Physics. $3 489634
650 2 4 $a Optics and Electrodynamics. $3 376879
700 1 $a Schnohr, Claudia S. $3 712678
700 1 $a Ridgway, Mark C. $3 712679
710 2 $a SpringerLink (Online service) $3 273601
773 0 $t Springer eBooks
830 0 $a Springer series in optical sciences ; $v v. 93. $3 438651
856 4 0 $u http://dx.doi.org/10.1007/978-3-662-44362-0
950 $a Physics and Astronomy (Springer-11651)