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Circuit design on plastic foils

Cantatore, Eugenio.

Circuit design on plastic foils

Record Type:	Electronic resources : Monograph/item
Title/Author:	Circuit design on plastic foilsby Daniele Raiteri, Eugenio Cantatore, Arthur H.M. van Roermund.
Author:	Raiteri, Daniele.
other author:	Cantatore, Eugenio.
Published:	Cham :Springer International Publishing :2015.
Description:	x, 130 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Engineering.
Online resource:	http://dx.doi.org/10.1007/978-3-319-11427-9
ISBN:	9783319114279 (electronic bk.)

Circuit design on plastic foils
Raiteri, Daniele.

Circuit design on plastic foils[electronic resource] /by Daniele Raiteri, Eugenio Cantatore, Arthur H.M. van Roermund. - Cham :Springer International Publishing :2015. - x, 130 p. :ill., digital ;24 cm. - Analog circuits and signal processing,1872-082X. - Analog circuits and signal processing..

Introduction -- Applications of large-area electronics on foils -- State of the art in circuit design -- Device modeling and characterization -- Sensor frontend architecture -- Circuit design for analog signal conditioning -- Circuit design for data conversion -- Circuit design for digital processing -- Conclusions.

This book illustrates a variety of circuit designs on plastic foils and provides all the information needed to undertake successful designs in large-area electronics. The authors demonstrate architectural, circuit, layout, and device solutions and explain the reasons and the creative process behind each. Readers will learn how to keep under control large-area technologies and achieve robust, reliable circuit designs that can face the challenges imposed by low-cost low-temperature high-throughput manufacturing. Discusses implications of problems associated with large-area electronics and compares them to standard silicon; Provides the basis for understanding physics and modeling of disordered material; Includes guidelines to quickly setup the basic CAD tools enabling efficient and reliable designs; Illustrates practical solutions to cope with hard/soft faults, variability, mismatch, aging and bias stress at architecture, circuit, layout, and device levels.

ISBN: 9783319114279 (electronic bk.)

Standard No.: 10.1007/978-3-319-11427-9doiSubjects--Topical Terms:

210888
Engineering.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

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