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Scanning probe microscopy in industr...

Yablon, Dalia G., (1975-)

Scanning probe microscopy in industrial applicationsnanomechanical characterization /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Scanning probe microscopy in industrial applicationsedited by Dalia G. Yablon.
Reminder of title:	nanomechanical characterization /
other author:	Yablon, Dalia G.,
Published:	Hoboken, New Jersey :Wiley,2014.
Description:	1 online resource (xix, 347 p.)
Subject:	Scanning probe microscopyIndustrial applications.
Online resource:	http://onlinelibrary.wiley.com/book/10.1002/9781118723111
ISBN:	9781118723111 (electronic bk.)

Scanning probe microscopy in industrial applicationsnanomechanical characterization /
Scanning probe microscopy in industrial applicationsnanomechanical characterization /[electronic resource] :edited by Dalia G. Yablon. - Hoboken, New Jersey :Wiley,2014. - 1 online resource (xix, 347 p.)

Includes bibliographical references and index.

Overview of Atomic Force Microscopy / Dalia G Yablon -- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick -- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman -- Phase Imaging / Dalia G Yablon, Greg Haugstad -- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore -- Guide to Best Practices for AFM Users / Greg Haugstad -- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull -- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann -- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon -- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris -- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz -- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano -- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm -- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani -- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad.

ISBN: 9781118723111 (electronic bk.)Subjects--Topical Terms:

275351
Scanning probe microscopy
--Industrial applications.

LC Class. No.: QH212.S33

Dewey Class. No.: 502.8/2

Scanning probe microscopy in industrial applicationsnanomechanical characterization /
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020 $a 9781118723111 (electronic bk.)
020 $a 1118723112 (electronic bk.)
020 $a 9781118723142 (electronic bk.)
020 $z 9781118288238 (hardback)
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040 $a DG1 $b eng $c DG1 $d CUS $d OCLCO
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082 0 4 $a 502.8/2 $2 23
245 0 0 $a Scanning probe microscopy in industrial applications $h [electronic resource] : $b nanomechanical characterization / $c edited by Dalia G. Yablon.
260 $a Hoboken, New Jersey : $b Wiley, $c 2014.
300 $a 1 online resource (xix, 347 p.)
504 $a Includes bibliographical references and index.
505 0 $a Overview of Atomic Force Microscopy / Dalia G Yablon -- Understanding the Tip-Sample Contact / Tevis D B Jacobs, C Mathew Mate, Kevin T Turner, Robert W Carpick -- Understanding Surface Forces Using Static and Dynamic Approach-Retraction Curves / Sudharsan Balasubramaniam, Daniel Kiracofe, Arvind Raman -- Phase Imaging / Dalia G Yablon, Greg Haugstad -- Dynamic Contact AFM Methods for Nanomechanical Properties / Donna C Hurley, Jason P Killgore -- Guide to Best Practices for AFM Users / Greg Haugstad -- Nanoindentation Measurements of Mechanical Properties of Very Thin Films and Nanostructured Materials at High Spatial Resolution / Steve J Bull -- Scanning Probe Microscopy for Critical Measurements in the Semiconductor Industry / Foucher Johann -- Atomic Force Microscopy of Polymers / Andy H Tsou, Dalia G Yablon -- Unraveling Links between Food Structure and Function with Probe Microscopy / A Patrick Gunning, Victor J Morris -- Microcantilever Sensors for Petrochemical Applications / Alan M Schilowitz -- Applications of Scanning Probe Methods in Cosmetic Science / Gustavo S Luengo, Anthony Galliano -- Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development / Matthew S Lamm -- Comparative Nanomechanical Study of Multiharmonic Force Microscopy and Nanoindentation on Low Dielectric Constant Materials / Katharine Walz, Robin King, Willi Volksen, Geraud Dubois, Jane Frommer, Kumar Virwani -- Nanomechanical Characterization of Biomaterial Surfaces / Klaus Wormuth, Greg Haugstad.
588 $a Description based on online resource; title from PDF title page (Wiley, viewed December 9, 2013).
650 0 $a Scanning probe microscopy $x Industrial applications. $3 275351
650 0 $a Materials $x Microscopy. $3 192645
700 1 $a Yablon, Dalia G., $d 1975- $3 722256
856 4 0 $u http://onlinelibrary.wiley.com/book/10.1002/9781118723111