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Pattern recognition and image analys...

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Pattern recognition and image analysis7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015 : proceedings /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Pattern recognition and image analysisedited by Roberto Paredes, Jaime S. Cardoso, Xose M. Pardo.
Reminder of title:	7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015 : proceedings /
remainder title:	IbPRIA 2015
other author:	Paredes, Roberto.
corporate name:
Published:	Cham :Springer International Publishing :2015.
Description:	xvi, 753 p. :ill., digital ;24 cm.
Contained By:	Springer eBooks
Subject:	Optical pattern recognition
Online resource:	http://dx.doi.org/10.1007/978-3-319-19390-8
ISBN:	9783319193908 (electronic bk.)

Pattern recognition and image analysis7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015 : proceedings /
Pattern recognition and image analysis7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015 : proceedings /[electronic resource] :IbPRIA 2015edited by Roberto Paredes, Jaime S. Cardoso, Xose M. Pardo. - Cham :Springer International Publishing :2015. - xvi, 753 p. :ill., digital ;24 cm. - Lecture notes in computer science,91170302-9743 ;. - Lecture notes in computer science ;4891..

This book constitutes the proceedings of the 7th Iberian Conference on Pattern Recognition and Image Analysis, IbPRIA 2015, held in Santiage de Compostela, Spain, in June 2015. The 83 papers presented in this volume were carefully reviewed and selected from 141 submissions. They were organized in topical sections named: Pattern Recognition and Machine Learning; Computer Vision; Image and Signal Processing; Applications; Medical Image; Pattern Recognition and Machine Learning; Computer Vision; Image and Signal Processing; and Applications.

ISBN: 9783319193908 (electronic bk.)

Standard No.: 10.1007/978-3-319-19390-8doiSubjects--Topical Terms:

253633
Optical pattern recognition

LC Class. No.: TA1650

Dewey Class. No.: 006.42

Pattern recognition and image analysis7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015 : proceedings /
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