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Silicon analog componentsdevice desi...
~
El-Kareh, Badih.
Silicon analog componentsdevice design, process integration, characterization, and reliability /
Record Type:
Electronic resources : Monograph/item
Title/Author:
Silicon analog componentsby Badih El-Kareh, Lou N. Hutter.
Reminder of title:
device design, process integration, characterization, and reliability /
Author:
El-Kareh, Badih.
other author:
Hutter, Lou N.
Published:
New York, NY :Springer New York :2015.
Description:
xli, 607 p. :ill., digital ;24 cm.
Contained By:
Springer eBooks
Subject:
Analog integrated circuitsMaterials.
Online resource:
http://dx.doi.org/10.1007/978-1-4939-2751-7
ISBN:
9781493927517 (electronic bk.)
Silicon analog componentsdevice design, process integration, characterization, and reliability /
El-Kareh, Badih.
Silicon analog components
device design, process integration, characterization, and reliability /[electronic resource] :by Badih El-Kareh, Lou N. Hutter. - New York, NY :Springer New York :2015. - xli, 607 p. :ill., digital ;24 cm.
The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.
This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors' extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.
ISBN: 9781493927517 (electronic bk.)
Standard No.: 10.1007/978-1-4939-2751-7doiSubjects--Topical Terms:
726587
Analog integrated circuits
--Materials.
LC Class. No.: TK7874
Dewey Class. No.: 621.3815
Silicon analog componentsdevice design, process integration, characterization, and reliability /
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The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.
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This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors' extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.
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based on 0 review(s)
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電子館藏
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1 records • Pages 1 •
1
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000000118035
電子館藏
1圖書
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EB TK7874 E43 2015
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0
1 records • Pages 1 •
1
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http://dx.doi.org/10.1007/978-1-4939-2751-7
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